Integrated circuits - Very large scale integration - Design.
概要
| 作品: | 4 作品在 1 项出版品 1 种语言 | |
|---|---|---|
书目信息
System-on-chip test architectures[electronic resource] :nanometer design for testability /
by:
(书目-语言数据,印刷品)
VLSI test principles and architectures[electronic resource] :design for testability /
by:
(书目-语言数据,印刷品)
主题