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VLSI test principles and architectures[electronic resource] :design for testability /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.39/5
書名/作者:	VLSI test principles and architectures : design for testability // edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
其他作者:	Wang, Laung-Terng.
出版者:	Amsterdam ; : Elsevier Morgan Kaufmann Publishers,, c2006.
面頁冊數:	1 online resource (xxx, 777 p.) : : ill.
標題:	Integrated circuits - Very large scale integration
標題:	Integrated circuits - Very large scale integration
標題:	Circuits int�egr�es �a tr�es grande �echelle - Essais.
標題:	Circuits int�egr�es �a tr�es grande �echelle - Conception et construction.
標題:	TECHNOLOGY & ENGINEERING - Electronics
標題:	TECHNOLOGY & ENGINEERING - Electronics
標題:	COMPUTERS - Logic Design.
標題:	Circuitos integrados vlsi.
標題:	Integrated circuits / Very large scale integration / Testing.
標題:	Integrated circuits / Very large scale integration / Design.
標題:	Testen.
標題:	VLSI.
ISBN:	9780123705976
ISBN:	0123705975
ISBN:	9780080474793 (electronic bk.)
ISBN:	0080474799 (electronic bk.)
ISBN:	6610966842 (electronic bk.)
ISBN:	9786610966844 (electronic bk.)
書目註:	Includes bibliographical references and index.
內容註:	Chapter 1 Introduction -- Chapter 2 Design for Testability -- Chapter 3 Logic and Fault Simulation -- Chapter 4 Test Generation -- Chapter 5 Logic Built-In Self-Test -- Chapter 6 Test Compression -- Chapter 7 Logic Diagnosis -- Chapter 8 Memory Testing and Built-In Self-Test -- Chapter 9 Memory Diagnosis and Built-In Self-Repair -- Chapter 10 Boundary Scan and Core-Based Testing -- Chapter 11 Analog and Mixed-Signal Testing -- Chapter 12 Test Technology Trends in the Nanometer Age.
摘要、提要註:	This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
電子資源:	http://www.sciencedirect.com/science/book/9780123705976

VLSI test principles and architectures[electronic resource] :design for testability /
VLSI test principles and architecturesdesign for testability /[electronic resource] :edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - Amsterdam ;Elsevier Morgan Kaufmann Publishers,c2006. - 1 online resource (xxx, 777 p.) :ill. - The Morgan Kaufmann series in systems on silicon. - Morgan Kaufmann series in systems on silicon..

Includes bibliographical references and index.

Chapter 1 Introduction -- Chapter 2 Design for Testability -- Chapter 3 Logic and Fault Simulation -- Chapter 4 Test Generation -- Chapter 5 Logic Built-In Self-Test -- Chapter 6 Test Compression -- Chapter 7 Logic Diagnosis -- Chapter 8 Memory Testing and Built-In Self-Test -- Chapter 9 Memory Diagnosis and Built-In Self-Repair -- Chapter 10 Boundary Scan and Core-Based Testing -- Chapter 11 Analog and Mixed-Signal Testing -- Chapter 12 Test Technology Trends in the Nanometer Age.

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

ISBN: 9780123705976

Source: 132281:132389Elsevier Science & Technologyhttp://www.sciencedirect.comSubjects--Topical Terms:

417282
Integrated circuits
--Very large scale integrationIndex Terms--Genre/Form:

336502
Electronic books.

LC Class. No.: TK7874.75 / .V587 2006eb

Dewey Class. No.: 621.39/5

VLSI test principles and architectures[electronic resource] :design for testability /
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