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Characterization of microstructures ...

Rong, Yonghua.

Characterization of microstructures by analytical electron microscopy (AEM)[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	620.1157
書名/作者:	Characterization of microstructures by analytical electron microscopy (AEM)/ by Yonghua Rong.
作者:	Rong, Yonghua.
出版者:	Berlin, Heidelberg : : Springer Berlin Heidelberg,, 2012.
面頁冊數:	xviii, 552 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Nanostructured materials - Nondestructive testing.
標題:	Electron microscopy.
標題:	Materials Science.
標題:	Characterization and Evaluation of Materials.
標題:	Condensed Matter Physics.
標題:	Optics, Optoelectronics, Plasmonics and Optical Devices.
ISBN:	9783642201196 (electronic bk.)
ISBN:	9783642201189 (paper)
電子資源:	http://dx.doi.org/10.1007/978-3-642-20119-6

Characterization of microstructures by analytical electron microscopy (AEM)[electronic resource] /
Rong, Yonghua.

Characterization of microstructures by analytical electron microscopy (AEM)[electronic resource] /by Yonghua Rong. - Berlin, Heidelberg :Springer Berlin Heidelberg,2012. - xviii, 552 p. :ill., digital ;24 cm.

ISBN: 9783642201196 (electronic bk.)Subjects--Topical Terms:

469691
Nanostructured materials
--Nondestructive testing.

LC Class. No.: TA417.23 / .R66 2012

Dewey Class. No.: 620.1157

Characterization of microstructures by analytical electron microscopy (AEM)[electronic resource] /
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