Covers
Wang, Laung-Terng.
Overview
| Works: | 6 works in 0 publications in 0 languages | |
|---|---|---|
Titles
System-on-chip test architectures[electronic resource] :nanometer design for testability /
by:
ScienceDirect (Online service); Stroud, Charles E.; Touba, Nur A.; Wang, Laung-Terng.
(Language materials, printed)
VLSI test principles and architectures[electronic resource] :design for testability /
by:
Wang, Laung-Terng.; Wen, Xiaoqing.; Wu, Cheng-Wen, (EE Ph. D.)
(Language materials, printed)
Electronic design automation[electronic resource] :synthesis, verification, and test /
by:
Chang, Yao-Wen.; Cheng, Kwang-Ting, (1961-); ScienceDirect (Online service); Wang, Laung-Terng.
(Language materials, printed)
Subjects
Electronic circuit design
Circuits int�egr�es �a tr�es grande �echelle
Integrated circuits / Very large scale integration / Testing.
VLSI.
COMPUTERS
Integrated circuits / Very large scale integration / Design.
Computer-aided design.
TECHNOLOGY & ENGINEERING
Circuitos integrados vlsi.
Testen.
Systems on a chip
Integrated circuits