Integrated circuits - Very large scale integration - Testing.
Overview
Works: | 3 works in 1 publications in 1 languages |
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Titles
System-on-chip test architectures[electronic resource] :nanometer design for testability /
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(Language materials, printed)
VLSI test principles and architectures[electronic resource] :design for testability /
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(Language materials, printed)
Debug automation from pre-silicon to post-silicon[electronic resource] /
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(Language materials, printed)
Subjects