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Compound semiconductor radiation det...

Owens, Alan.

Compound semiconductor radiation detectors /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	537.5/352
書名/作者:	Compound semiconductor radiation detectors // Alan Owens.
作者:	Owens, Alan.
出版者:	Boca Raton, FL : : CRC Press,, c2012.
面頁冊數:	xlv, 521 p., [12] p. of plates : : ill. (some col.) ;; 25 cm.
標題:	X-rays - Measurement
標題:	Gamma ray detectors - Materials.
標題:	X-ray diffractometer - Materials.
標題:	Compound semiconductors.
ISBN:	9781439873120 (hbk.) :
ISBN:	1439873127 (hbk.)
書目註:	Includes bibliographical references and index.
摘要、提要註:	"Although elemental semiconductors such as silicon and germanium are standard for energy dispersive spectroscopy in the laboratory, their use for an increasing range of applications is becoming marginalized by their physical limitations, namely the need for ancillary cooling, their modest stopping powers, and radiation intolerance. Compound semiconductors, on the other hand, encompass such a wide range of physical and electronic properties that they have become viable competitors in a number of applications. Compound Semiconductor Radiation Detectors is a consolidated source of information on all aspects of the use of compound semiconductors for radiation detection and measurement. Bringing together information scattered across many disciplines, this book summarizes the current status of research in compound semiconductor radiation detectors. It examines the properties, growth, and characterization of compound semiconductors as well as the fabrication of radiation sensors, with particular emphasis on the X- and gamma-ray regimes. It explores the limitations of compound semiconductors and discusses current efforts to improve spectral performances, pointing to where future discoveries may lie. A timely resource for the established researcher, this book serves as a comprehensive and illustrated reference on material science, crystal growth, metrology, detector physics, and spectroscopy. It can also be used as a textbook for those new to the field of compound semiconductors and their application to radiation detection and measurement"--Provided by publisher.

Compound semiconductor radiation detectors /
Owens, Alan.

Compound semiconductor radiation detectors /Alan Owens. - Boca Raton, FL :CRC Press,c2012. - xlv, 521 p., [12] p. of plates :ill. (some col.) ;25 cm. - Series in sensors. - Sensors series..

Includes bibliographical references and index.

"Although elemental semiconductors such as silicon and germanium are standard for energy dispersive spectroscopy in the laboratory, their use for an increasing range of applications is becoming marginalized by their physical limitations, namely the need for ancillary cooling, their modest stopping powers, and radiation intolerance. Compound semiconductors, on the other hand, encompass such a wide range of physical and electronic properties that they have become viable competitors in a number of applications. Compound Semiconductor Radiation Detectors is a consolidated source of information on all aspects of the use of compound semiconductors for radiation detection and measurement. Bringing together information scattered across many disciplines, this book summarizes the current status of research in compound semiconductor radiation detectors. It examines the properties, growth, and characterization of compound semiconductors as well as the fabrication of radiation sensors, with particular emphasis on the X- and gamma-ray regimes. It explores the limitations of compound semiconductors and discusses current efforts to improve spectral performances, pointing to where future discoveries may lie. A timely resource for the established researcher, this book serves as a comprehensive and illustrated reference on material science, crystal growth, metrology, detector physics, and spectroscopy. It can also be used as a textbook for those new to the field of compound semiconductors and their application to radiation detection and measurement"--Provided by publisher.

ISBN: 9781439873120 (hbk.) :NTD 6,545

LCCN: 2012000808Subjects--Topical Terms:

740684
X-rays
--Measurement

LC Class. No.: QC481.5 / .O94 2012

Dewey Class. No.: 537.5/352

Compound semiconductor radiation detectors /
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