Computational texture and patterns :...
Dana, Kristin J., (1968-)

 

  • Computational texture and patterns :from textons to deep learning /
  • 紀錄類型: 書目-電子資源 : Monograph/item
    杜威分類號: 006.4
    書名/作者: Computational texture and patterns : : from textons to deep learning // Kristin J. Dana.
    作者: Dana, Kristin J.,
    面頁冊數: 1 PDF (xiii, 99 pages) : : illustrations.
    附註: Part of: Synthesis digital library of engineering and computer science.
    標題: Pattern recognition systems.
    標題: Texture mapping.
    ISBN: 9781681730127
    書目註: Includes bibliographical references (pages 77-98).
    內容註: 1. Visual patterns and texture -- 1.1 Patterns in nature -- 1.2 Big data patterns -- 1.3 Temporal patterns -- 1.4 Organization --
    摘要、提要註: Visual pattern analysis is a fundamental tool in mining data for knowledge. Computational representations for patterns and texture allow us to summarize, store, compare, and label in order to learn about the physical world. Our ability to capture visual imagery with cameras and sensors has resulted in vast amounts of raw data, but using this information effectively in a task-specific manner requires sophisticated computational representations. We enumerate specific desirable traits for these representations: (1) intraclass invariance--to support recognition; (2) illumination and geometric invariance for robustness to imaging conditions; (3) support for prediction and synthesis to use the model to infer continuation of the pattern; (4) support for change detection to detect anomalies and perturbations; and (5) support for physics-based interpretation to infer system properties from appearance. In recent years, computer vision has undergone a metamorphosis with classic algorithms adapting to new trends in deep learning. This text provides a tour of algorithm evolution including pattern recognition, segmentation and synthesis. We consider the general relevance and prominence of visual pattern analysis and applications that rely on computational models.
    電子資源: https://ieeexplore.ieee.org/servlet/opac?bknumber=8467550
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