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Basic concepts of X-ray diffraction /
~
Zolotoyabko, Emil.
Basic concepts of X-ray diffraction /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
548.83
書名/作者:
Basic concepts of X-ray diffraction // Emil Zolotoyabko.
作者:
Zolotoyabko, Emil.
出版者:
Weinheim : : Wiley-VCH,, c2014.
面頁冊數:
xii, 297 p. : : ill. (some col.) ;; 25 cm.
標題:
X-rays - Diffraction.
ISBN:
9783527335619 (pbk.) :
書目註:
Includes bibliographical references (p. 285-290) and index.
內容註:
Preface -- Introduction -- Diffraction phenomena in optics -- Wave propagation in periodic media -- Dynamical diffraction of particles and fields: general considerations -- Dynamical x-ray diffraction: the Ewald-Laue approach -- Dynamical diffraction: the Darwin approach -- Dynamical diffraction in nonhomogeneous media: the Takagi-Taupin approach -- X-ray absorption -- Dynamical diffraction in single-scattering approximation: simulation of high-resolution x-ray diffraction in heterostructures and multilayers -- Reciprocal space mapping and strain measurements in heterostructures -- X-ray diffraction in kinematic approximation -- X-ray diffraction from polycrystalline materials -- Applications to materials science: structure analysis -- Applications to materials science: phase analysis -- Applications to materials science: preferred orientation (texture) analysis -- Applications to materials science: line broadening analysis -- Applications to materials science: residual strain/stress measurements -- Impact of lattice defects on x-ray diffraction -- X-ray diffraction measurements in polycrystals with high spatial resolution -- Inelastic scattering -- Interaction of x-rays with acoustic waves -- Time-resolved x-ray diffraction -- X-ray sources -- X-ray focusing optics -- X-ray diffractometers -- References -- Index.
摘要、提要註:
"Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental lawss that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications..."-- Back cover.
Basic concepts of X-ray diffraction /
Zolotoyabko, Emil.
Basic concepts of X-ray diffraction /
Emil Zolotoyabko. - Weinheim :Wiley-VCH,c2014. - xii, 297 p. :ill. (some col.) ;25 cm.
Includes bibliographical references (p. 285-290) and index.
Preface -- Introduction -- Diffraction phenomena in optics -- Wave propagation in periodic media -- Dynamical diffraction of particles and fields: general considerations -- Dynamical x-ray diffraction: the Ewald-Laue approach -- Dynamical diffraction: the Darwin approach -- Dynamical diffraction in nonhomogeneous media: the Takagi-Taupin approach -- X-ray absorption -- Dynamical diffraction in single-scattering approximation: simulation of high-resolution x-ray diffraction in heterostructures and multilayers -- Reciprocal space mapping and strain measurements in heterostructures -- X-ray diffraction in kinematic approximation -- X-ray diffraction from polycrystalline materials -- Applications to materials science: structure analysis -- Applications to materials science: phase analysis -- Applications to materials science: preferred orientation (texture) analysis -- Applications to materials science: line broadening analysis -- Applications to materials science: residual strain/stress measurements -- Impact of lattice defects on x-ray diffraction -- X-ray diffraction measurements in polycrystals with high spatial resolution -- Inelastic scattering -- Interaction of x-rays with acoustic waves -- Time-resolved x-ray diffraction -- X-ray sources -- X-ray focusing optics -- X-ray diffractometers -- References -- Index.
"Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental lawss that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications..."-- Back cover.
ISBN: 9783527335619 (pbk.) :NTD 3,029Subjects--Topical Terms:
337913
X-rays
--Diffraction.
LC Class. No.: QC482.D5 / Z65 2014
Dewey Class. No.: 548.83
Basic concepts of X-ray diffraction /
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Preface -- Introduction -- Diffraction phenomena in optics -- Wave propagation in periodic media -- Dynamical diffraction of particles and fields: general considerations -- Dynamical x-ray diffraction: the Ewald-Laue approach -- Dynamical diffraction: the Darwin approach -- Dynamical diffraction in nonhomogeneous media: the Takagi-Taupin approach -- X-ray absorption -- Dynamical diffraction in single-scattering approximation: simulation of high-resolution x-ray diffraction in heterostructures and multilayers -- Reciprocal space mapping and strain measurements in heterostructures -- X-ray diffraction in kinematic approximation -- X-ray diffraction from polycrystalline materials -- Applications to materials science: structure analysis -- Applications to materials science: phase analysis -- Applications to materials science: preferred orientation (texture) analysis -- Applications to materials science: line broadening analysis -- Applications to materials science: residual strain/stress measurements -- Impact of lattice defects on x-ray diffraction -- X-ray diffraction measurements in polycrystals with high spatial resolution -- Inelastic scattering -- Interaction of x-rays with acoustic waves -- Time-resolved x-ray diffraction -- X-ray sources -- X-ray focusing optics -- X-ray diffractometers -- References -- Index.
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337913
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