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Thin film materials :stress, defect ...

Freund, L. B.,

Thin film materials :stress, defect formation, and surface evolution /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.3815/2
書名/作者:	Thin film materials : : stress, defect formation, and surface evolution // L.B. Freund, S. Suresh.
作者:	Freund, L. B.,
其他作者:	Suresh, S.
面頁冊數:	1 online resource (xviii, 750 pages) : : digital, PDF file(s).
附註:	Title from publisher's bibliographic system (viewed on 05 Oct 2015).
標題:	Thin films.
ISBN:	9780511754715 (ebook)
摘要、提要註:	Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.
電子資源:	http://dx.doi.org/10.1017/CBO9780511754715

Thin film materials :stress, defect formation, and surface evolution /
Freund, L. B.,

Thin film materials :stress, defect formation, and surface evolution /L.B. Freund, S. Suresh. - 1 online resource (xviii, 750 pages) :digital, PDF file(s).

Title from publisher's bibliographic system (viewed on 05 Oct 2015).

Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.

ISBN: 9780511754715 (ebook)Subjects--Topical Terms:

183807
Thin films.

LC Class. No.: TA418.9.T45 / F74 2003

Dewey Class. No.: 621.3815/2

Thin film materials :stress, defect formation, and surface evolution /
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