大葉大學圖書館 |

Electron microprobe analysis and scanning electron microscopy in geology /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	551.8
書名/作者:	Electron microprobe analysis and scanning electron microscopy in geology // S.J.B. Reed.
其他題名:	Electron Microprobe Analysis & Scanning Electron Microscopy in Geology
作者:	Reed, S. J. B.,
面頁冊數:	1 online resource (xiii, 189 pages) : : digital, PDF file(s).
附註:	Title from publisher's bibliographic system (viewed on 05 Oct 2015).
標題:	Petrofabric analysis.
標題:	Electron probe microanalysis.
標題:	Scanning electron microscopy.
ISBN:	9780511610561 (ebook)
摘要、提要註:	Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
電子資源:	http://dx.doi.org/10.1017/CBO9780511610561

Electron microprobe analysis and scanning electron microscopy in geology /
Reed, S. J. B.,

Electron microprobe analysis and scanning electron microscopy in geology /Electron Microprobe Analysis & Scanning Electron Microscopy in GeologyS.J.B. Reed. - Second edition. - 1 online resource (xiii, 189 pages) :digital, PDF file(s).

Title from publisher's bibliographic system (viewed on 05 Oct 2015).

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

ISBN: 9780511610561 (ebook)Subjects--Topical Terms:

566356
Petrofabric analysis.

LC Class. No.: QE440 / .R43 2005

Dewey Class. No.: 551.8

Electron microprobe analysis and scanning electron microscopy in geology /
LDR:02187nam a22003138i 4500 001 448756
003 UkCbUP
005 20160211114924.0
006 m|||||o||d||||||||
007 cr||||||||||||
008 161201s2005||||enk o ||1 0|eng|d
020 $a 9780511610561 (ebook)
020 $z 9780521848756 (hardback)
020 $z 9780521142304 (paperback)
035 $a CR9780511610561
040 $a UkCbUP $b eng $e rda $c UkCbUP
050 0 0 $a QE440 $b .R43 2005
082 0 4 $a 551.8 $2 22
100 1 $a Reed, S. J. B., $e author. $3 643760
245 1 0 $a Electron microprobe analysis and scanning electron microscopy in geology / $c S.J.B. Reed.
246 3 $a Electron Microprobe Analysis & Scanning Electron Microscopy in Geology
250 $a Second edition.
264 1 $a Cambridge : $b Cambridge University Press, $c 2005.
300 $a 1 online resource (xiii, 189 pages) : $b digital, PDF file(s).
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
500 $a Title from publisher's bibliographic system (viewed on 05 Oct 2015).
520 $a Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
650 0 $a Petrofabric analysis. $3 566356
650 0 $a Electron probe microanalysis. $3 643761
650 0 $a Scanning electron microscopy. $3 366466
776 0 8 $i Print version: $z 9780521848756
856 4 0 $u http://dx.doi.org/10.1017/CBO9780511610561