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Silicon analog components[electronic resource] :device design, process integration, characterization, and reliability /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.3815
書名/作者:	Silicon analog components : device design, process integration, characterization, and reliability // by Badih El-Kareh, Lou N. Hutter.
作者:	El-Kareh, Badih.
其他作者:	Hutter, Lou N.
出版者:	New York, NY : : Springer New York :, 2015.
面頁冊數:	xli, 607 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Analog integrated circuits - Materials.
標題:	Engineering.
標題:	Circuits and Systems.
標題:	Electronic Circuits and Devices.
標題:	Optical and Electronic Materials.
ISBN:	9781493927517 (electronic bk.)
ISBN:	9781493927500 (paper)
內容註:	The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.
摘要、提要註:	This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors' extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.
電子資源:	http://dx.doi.org/10.1007/978-1-4939-2751-7

Silicon analog components[electronic resource] :device design, process integration, characterization, and reliability /
El-Kareh, Badih.

Silicon analog componentsdevice design, process integration, characterization, and reliability /[electronic resource] :by Badih El-Kareh, Lou N. Hutter. - New York, NY :Springer New York :2015. - xli, 607 p. :ill., digital ;24 cm.

The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.

This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors' extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.

ISBN: 9781493927517 (electronic bk.)

Standard No.: 10.1007/978-1-4939-2751-7doiSubjects--Topical Terms:

627232
Analog integrated circuits
--Materials.

LC Class. No.: TK7874

Dewey Class. No.: 621.3815

Silicon analog components[electronic resource] :device design, process integration, characterization, and reliability /
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