Far- and deep-ultraviolet spectrosco...
Kawata, Satoshi.

 

  • Far- and deep-ultraviolet spectroscopy[electronic resource] /
  • 紀錄類型: 書目-語言資料,印刷品 : Monograph/item
    杜威分類號: 535.844
    書名/作者: Far- and deep-ultraviolet spectroscopy/ edited by Yukihiro Ozaki, Satoshi Kawata.
    其他作者: Ozaki, Yukihiro.
    出版者: Tokyo : : Springer Japan :, 2015.
    面頁冊數: vii, 174 p. : : ill. (some col.), digital ;; 24 cm.
    Contained By: Springer eBooks
    標題: Ultraviolet spectroscopy.
    標題: Chemistry.
    標題: Spectroscopy/Spectrometry.
    標題: Atomic/Molecular Structure and Spectra.
    標題: Characterization and Evaluation of Materials.
    標題: Physical Chemistry.
    ISBN: 9784431555490 (electronic bk.)
    ISBN: 9784431555483 (paper)
    內容註: Introduction to FUV and DUV Spectroscopy -- Instrumentation for FUV spectroscopy -- Electronic Structure and Transition in the Far-Ultraviolet Region -- Water research by far-ultraviolet spectroscopy -- Far-Ultraviolet Spectroscopy and Deep-Ultraviolet Spectroscopy: Industrial Applications -- Electronic structure of TiO2 studied by far-ultraviolet and deep-ultraviolet spectroscopy -- Deep-ultraviolet microscopy and microspectroscopy -- Deep-Ultraviolet Surface-Enhanced Raman Scattering -- Coupling of Deep-Ultraviolet Photons and Electrons.
    摘要、提要註: This book is the first comprehensive work to be published on far-ultraviolet (FUV) and deep-ultraviolet (DUV) spectroscopy, subjects of keen interest because new areas of spectroscopy have been born in the FUV and DUV regions. For example, FUV spectroscopy in condensed matter has become possible due to the development of attenuated total reflection/FUV spectroscopy. As other examples, DUV surface-enhanced Raman scattering and DUV tip-enhanced Raman scattering have received great attention. Imaging by DUV spectroscopy has also become an area of interest. More recently, FUV and DUV spectroscopy have shown potential for applications in several fields including industry. All these topics are described in this book. Doctoral students and researchers in universities and national research institutes as well as researchers in various industries will find this volume highly useful.
    電子資源: http://dx.doi.org/10.1007/978-4-431-55549-0
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