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Noncontact atomic force microscopy.[electronic resource] /Volume 3

紀錄類型:	書目-電子資源 : Monograph/item
杜威分類號:	620.5
書名/作者:	Noncontact atomic force microscopy./ edited by Seizo Morita ... [et al.].
其他作者:	Morita, Seizo.
出版者:	Cham : : Springer International Publishing :, 2015.
面頁冊數:	xxii, 527 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Physics.
標題:	Nanoscale Science and Technology.
標題:	Surfaces and Interfaces, Thin Films.
標題:	Spectroscopy and Microscopy.
標題:	Nanotechnology.
標題:	Atomic force microscopy.
ISBN:	9783319155883 (electronic bk.)
ISBN:	9783319155876 (paper)
內容註:	From the Contents: Introduction -- 3D Force-Field Spectroscopy -- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts -- Spectroscopy and Manipulation Using AFM/STM at Room Temperature -- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy -- Non-Contact Friction -- Magnetic Exchange Force Spectroscopy.
摘要、提要註:	This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
電子資源:	http://dx.doi.org/10.1007/978-3-319-15588-3

Noncontact atomic force microscopy.[electronic resource] /Volume 3
Noncontact atomic force microscopy.Volume 3[electronic resource] /edited by Seizo Morita ... [et al.]. - Cham :Springer International Publishing :2015. - xxii, 527 p. :ill., digital ;24 cm. - NanoScience and technology,1434-4904. - NanoScience and technology..

From the Contents: Introduction -- 3D Force-Field Spectroscopy -- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts -- Spectroscopy and Manipulation Using AFM/STM at Room Temperature -- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy -- Non-Contact Friction -- Magnetic Exchange Force Spectroscopy.

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

ISBN: 9783319155883 (electronic bk.)

Standard No.: 10.1007/978-3-319-15588-3doiSubjects--Topical Terms:

171863
Physics.

LC Class. No.: QH212.A78 / N663 2015

Dewey Class. No.: 620.5

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