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Fringe pattern analysis for optical ...

Padilla, J. Moisés

Fringe pattern analysis for optical metrology[electronic resource] :theory, algorithms, and applications /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	530.8
書名/作者:	Fringe pattern analysis for optical metrology : theory, algorithms, and applications // Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.
作者:	Servin, Manuel.
其他作者:	Quiroga, J. Antonio
出版者:	Weinheim : : Wiley-VCH,, 2014.
面頁冊數:	1 online resource (xvi, 328 p.) : : ill.
標題:	Interferometry.
標題:	Diffraction patterns.
標題:	Optical measurements.
ISBN:	1306840880
ISBN:	9781306840880
ISBN:	9783527681082
ISBN:	3527681086
ISBN:	9783527681075
ISBN:	3527411526
ISBN:	9783527681105 (ePub)
ISBN:	3527681108 (ePub)
書目註:	Includes bibliographical references and index.
電子資源:	http://onlinelibrary.wiley.com/book/10.1002/9783527681075

Fringe pattern analysis for optical metrology[electronic resource] :theory, algorithms, and applications /
Servin, Manuel.

Fringe pattern analysis for optical metrologytheory, algorithms, and applications /[electronic resource] :Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla. - 1st ed. - Weinheim :Wiley-VCH,2014. - 1 online resource (xvi, 328 p.) :ill.

Includes bibliographical references and index.

ISBN: 1306840880Subjects--Topical Terms:

395509
Interferometry.

LC Class. No.: QC39 / .S384 2014

Dewey Class. No.: 530.8

Fringe pattern analysis for optical metrology[electronic resource] :theory, algorithms, and applications /
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020 $a 1306840880 $q (electronic bk.)
020 $a 9781306840880 $q (electronic bk.)
020 $a 9783527681082 $q (electronic bk.)
020 $a 3527681086 $q (electronic bk.)
020 $a 9783527681075 $q (electronic bk.)
020 $z 3527681078
020 $z 9783527681099
020 $z 3527681094
020 $z 9783527411528 $q (print)
020 $a 3527411526
020 $a 9783527681105 (ePub)
020 $a 3527681108 (ePub)
035 $a (OCoLC)881028799
035 $a ocn881028799
040 $a IDEBK $b eng $c IDEBK $d EBLCP $d E7B $d DG1 $d CUI $d N $d OCLCA $d OCLCQ $d OCLCF $d DEBSZ $d COO
050 4 $a QC39 $b .S384 2014
082 0 4 $a 530.8
100 1 $a Servin, Manuel. $3 624936
245 1 0 $a Fringe pattern analysis for optical metrology $h [electronic resource] : $b theory, algorithms, and applications / $c Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.
250 $a 1st ed.
260 $a Weinheim : $b Wiley-VCH, $c 2014.
300 $a 1 online resource (xvi, 328 p.) : $b ill.
504 $a Includes bibliographical references and index.
588 0 $a Online resource; title from PDF title page (Wiley, viewed August 1, 2014).
650 0 $a Interferometry. $3 395509
650 0 $a Diffraction patterns. $3 624939
650 0 $a Optical measurements. $3 174032
700 1 $a Quiroga, J. Antonio $q (Juan Antonio) $3 624937
700 1 $a Padilla, J. Moisés $q (José Moisés) $3 624938
856 4 0 $u http://onlinelibrary.wiley.com/book/10.1002/9783527681075

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