大葉大學圖書館 |

登入

回首頁

Terrestrial radiation effects in ULS...

Ibe, Eishi H.

Terrestrial radiation effects in ULSI devices and electronic systems[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.3815
書名/作者:	Terrestrial radiation effects in ULSI devices and electronic systems/ Eishi H. Ibe.
作者:	Ibe, Eishi H.
出版者:	Singapore : : John Wiley & Sons Inc., :, 2015.
面頁冊數:	1 online resource.
標題:	Electronic circuits - Effect of radiation on.
標題:	Integrated circuits - Ultra large scale integration
標題:	Integrated circuits - Effect of radiation on.
ISBN:	9781118479308 (electronic bk.)
ISBN:	1118479300 (electronic bk.)
ISBN:	9781118479315 (electronic bk.)
ISBN:	1118479319 (electronic bk.)
書目註:	Includes bibliographical references and index.
電子資源:	http://onlinelibrary.wiley.com/book/10.1002/9781118479308

Terrestrial radiation effects in ULSI devices and electronic systems[electronic resource] /
Ibe, Eishi H.

Terrestrial radiation effects in ULSI devices and electronic systems[electronic resource] /Eishi H. Ibe. - Singapore :John Wiley & Sons Inc., :2015. - 1 online resource.

Includes bibliographical references and index.

ISBN: 9781118479308 (electronic bk.)

LCCN: 2014022693Subjects--Topical Terms:

622915
Electronic circuits
--Effect of radiation on.

LC Class. No.: TK7870.285

Dewey Class. No.: 621.3815

Terrestrial radiation effects in ULSI devices and electronic systems[electronic resource] /
LDR:01082cam a2200325 i 4500 001 437008
003 OCoLC
005 20150118112736.0
006 m o d
007 cr |||||||||||
008 160125s2015 si ob 001 0 eng
010 $a 2014022693
020 $a 9781118479308 (electronic bk.)
020 $a 1118479300 (electronic bk.)
020 $a 9781118479315 (electronic bk.)
020 $a 1118479319 (electronic bk.)
020 $z 9781118479322
020 $z 1118479327
020 $z 9781118479292 (cloth : alk. paper)
020 $z 1118479297 (cloth : alk. paper)
035 $a (OCoLC)881318367
035 $a ocn881318367
040 $a DLC $b eng $c DLC $d OCLCO $d DG1 $d N
050 1 0 $a TK7870.285
082 0 0 $a 621.3815 $2 23
100 1 $a Ibe, Eishi H. $3 622914
245 1 0 $a Terrestrial radiation effects in ULSI devices and electronic systems $h [electronic resource] / $c Eishi H. Ibe.
260 $a Singapore : $b John Wiley & Sons Inc., : $b IEEE, $c 2015.
300 $a 1 online resource.
504 $a Includes bibliographical references and index.
588 0 $a Print version record.
650 0 $a Electronic circuits $x Effect of radiation on. $3 622915
650 0 $a Integrated circuits $x Ultra large scale integration $x Reliability. $3 622916
650 0 $a Integrated circuits $x Effect of radiation on. $3 403766
856 4 0 $u http://onlinelibrary.wiley.com/book/10.1002/9781118479308

筆 0 讀者評論

多媒體

多媒體檔案
http://onlinelibrary.wiley.com/book/10.1002/9781118479308

評論

Export

取書館別