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Fundamental principles of engineerin...

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Leach, R. K.

Fundamental principles of engineering nanometrology[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	620.50287
書名/作者:	Fundamental principles of engineering nanometrology/ Richard Leach.
作者:	Leach, R. K.
出版者:	Oxford, OX : : Elsevier, William Andrew,, 2014.
面頁冊數:	xxi, 361 p. : : ill. ;; 25 cm.
標題:	Metrology.
標題:	Microtechnology.
標題:	Nanotechnology.
ISBN:	9781455777532
ISBN:	9781455777532 (electronic bk.)
書目註:	Includes bibliographical references and index.
電子資源:	http://www.sciencedirect.com/science/book/9781455777532

Fundamental principles of engineering nanometrology[electronic resource] /
Leach, R. K.

Fundamental principles of engineering nanometrology[electronic resource] /Richard Leach. - 2nd ed. - Oxford, OX :Elsevier, William Andrew,2014. - xxi, 361 p. :ill. ;25 cm. - Micro & nano technologies series. - Micro & nano technologies..

Includes bibliographical references and index.

ISBN: 9781455777532Subjects--Topical Terms:

443968
Metrology.

LC Class. No.: T174.7 / .L42 2014

Dewey Class. No.: 620.50287

Fundamental principles of engineering nanometrology[electronic resource] /
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