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Trace-based post-silicon validation ...
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Liu, Xiao.
Trace-based post-silicon validation for VLSI circuits[electronic resource] /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
621.395
書名/作者:
Trace-based post-silicon validation for VLSI circuits/ by Xiao Liu, Qiang Xu.
作者:
Liu, Xiao.
其他作者:
Xu, Qiang.
出版者:
Cham ; : Springer International Publishing :, 2014.
面頁冊數:
xv, 108 p. : : ill., digital ;; 24 cm.
Contained By:
Springer eBooks
標題:
Integrated circuits - Very large scale integration
標題:
Integrated circuits - Verification.
標題:
Engineering.
標題:
Circuits and Systems.
標題:
Processor Architectures.
標題:
Semiconductors.
ISBN:
9783319005331 (electronic bk.)
ISBN:
9783319005324 (paper)
電子資源:
http://dx.doi.org/10.1007/978-3-319-00533-1
Trace-based post-silicon validation for VLSI circuits[electronic resource] /
Liu, Xiao.
Trace-based post-silicon validation for VLSI circuits
[electronic resource] /by Xiao Liu, Qiang Xu. - Cham ;Springer International Publishing :2014. - xv, 108 p. :ill., digital ;24 cm. - Lecture notes in electrical engineering ;252. - Lecture notes in electrical engineering ;v.107..
ISBN: 9783319005331 (electronic bk.)Subjects--Topical Terms:
418525
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874 / .L58 2014
Dewey Class. No.: 621.395
Trace-based post-silicon validation for VLSI circuits[electronic resource] /
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