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Electron microscopy and analysis /

~

Beanland, R.

Electron microscopy and analysis /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	502/.8/25
書名/作者:	Electron microscopy and analysis // Peter J. Goodhew, John Humphreys, Richard Beanland.
作者:	Goodhew, Peter J.
其他作者:	Humphreys, F. J.
出版者:	London ; : Taylor & Francis,, 2001.
面頁冊數:	x, 251 p. : : ill. ;; 24 cm.
標題:	Electron microscopy.
ISBN:	9780748409686 (pbk.) :
ISBN:	0748409688 (pbk.)
書目註:	Includes bibliographical references (p. [236]-237) and index.
電子資源:	http://www.loc.gov/catdir/enhancements/fy0652/00037716-d.html

Electron microscopy and analysis /
Goodhew, Peter J.

Electron microscopy and analysis /Peter J. Goodhew, John Humphreys, Richard Beanland. - 3rd ed. - London ;Taylor & Francis,2001. - x, 251 p. :ill. ;24 cm.

Includes bibliographical references (p. [236]-237) and index.

ISBN: 9780748409686 (pbk.) :NTD 2,352

LCCN: 00037716 Subjects--Topical Terms:

386317
Electron microscopy.

LC Class. No.: QH212.E4 / G62 2001

Dewey Class. No.: 502/.8/25

Electron microscopy and analysis /
LDR:00736cam a2200205 a 4500 001 420144
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008 150430s2001 enka b 001 0 eng
010 $a 00037716
020 $a 9780748409686 (pbk.) : $c NTD 2,352
020 $a 0748409688 (pbk.)
040 $a DLC $c DLC $d DLC $d DYU
041 0 $a eng
050 0 0 $a QH212.E4 $b G62 2001
082 0 0 $a 502/.8/25 $2 21
100 1 $a Goodhew, Peter J. $3 595142
245 1 0 $a Electron microscopy and analysis / $c Peter J. Goodhew, John Humphreys, Richard Beanland.
250 $a 3rd ed.
260 $a London ; $a New York : $b Taylor & Francis, $c 2001.
300 $a x, 251 p. : $b ill. ; $c 24 cm.
504 $a Includes bibliographical references (p. [236]-237) and index.
650 0 $a Electron microscopy. $3 386317
700 1 $a Humphreys, F. J. $3 486323
700 1 $a Beanland, R. $3 595143
856 4 2 $3 Publisher description $u http://www.loc.gov/catdir/enhancements/fy0652/00037716-d.html

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http://www.loc.gov/catdir/enhancements/fy0652/00037716-d.html

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