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Software process and product measure...

Dumke, Reiner R.

Software process and product measurement[electronic resource] :international conferences IWSM 2008, MetriKon 2008, and Mensura 2008, Munich, Germany, November 18-19, 2008 : proceedings /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	005.14
書名/作者:	Software process and product measurement : international conferences IWSM 2008, MetriKon 2008, and Mensura 2008, Munich, Germany, November 18-19, 2008 : proceedings // edited by Reiner R. Dumke ... [et al.].
其他題名:	IWSM 2008
作者:	International Workshop on Software Measurement
其他作者:	Dumke, Reiner R.
出版者:	Berlin, Heidelberg : : Springer Berlin Heidelberg,, 2008.
面頁冊數:	361 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Software measurement - Congresses.
標題:	Software engineering
標題:	Computer Science.
標題:	Software Engineering.
標題:	Management of Computing and Information Systems.
標題:	Computer Appl. in Administrative Data Processing.
標題:	Computers and Education.
ISBN:	9783540894032 (electronic bk.)
ISBN:	9783540894025 (paper)
電子資源:	http://dx.doi.org/10.1007/978-3-540-89403-2

Software process and product measurement[electronic resource] :international conferences IWSM 2008, MetriKon 2008, and Mensura 2008, Munich, Germany, November 18-19, 2008 : proceedings /
International Workshop on Software MeasurementMunich, Germany)(2008 :

Software process and product measurementinternational conferences IWSM 2008, MetriKon 2008, and Mensura 2008, Munich, Germany, November 18-19, 2008 : proceedings /[electronic resource] :IWSM 2008edited by Reiner R. Dumke ... [et al.]. - Berlin, Heidelberg :Springer Berlin Heidelberg,2008. - 361 p. :ill., digital ;24 cm. - Lecture notes in computer science,53380302-9743 ;. - Lecture notes in computer science ;7103..

ISBN: 9783540894032 (electronic bk.)Subjects--Topical Terms:

468918
Software measurement
--Congresses.

Dewey Class. No.: 005.14

Software process and product measurement[electronic resource] :international conferences IWSM 2008, MetriKon 2008, and Mensura 2008, Munich, Germany, November 18-19, 2008 : proceedings /
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