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Experimental techniques for low-temp...
~
Ekin, J. W.
Experimental techniques for low-temperature measurements[electronic resource] :cryostat design, material properties, and superconductor critical-current testing /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
536/.54
書名/作者:
Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing // Jack W. Ekin.
作者:
Ekin, J. W.
出版者:
Oxford ; : Oxford University Press,, 2006.
面頁冊數:
xxviii, 673 p. : : ill. ;; 26 cm.
標題:
Low temperatures - Measurement.
標題:
Low temperatures - Instruments.
標題:
Low temperature research.
標題:
Superconductors.
ISBN:
9780198570547
書目註:
Includes bibliographical references and index.
電子資源:
http://dx.doi.org/10.1093/acprof
:oso/9780198570547.001.0001
Experimental techniques for low-temperature measurements[electronic resource] :cryostat design, material properties, and superconductor critical-current testing /
Ekin, J. W.
Experimental techniques for low-temperature measurements
cryostat design, material properties, and superconductor critical-current testing /[electronic resource] :Jack W. Ekin. - Oxford ;Oxford University Press,2006. - xxviii, 673 p. :ill. ;26 cm.
Includes bibliographical references and index.
Electronic reproduction.
Oxford :
Oxford University Press,
2010.
(Oxford Scholarship Online).
Mode of access: World Wide Web. System requirements: Internet Explorer 6.0 (or higher) or Firefox 2.0 (or higher).
ISBN: 9780198570547
LCCN: 2006010332Subjects--Topical Terms:
394250
Low temperatures
--Measurement.
LC Class. No.: QC278 / .E45 2006
Dewey Class. No.: 536/.54
Experimental techniques for low-temperature measurements[electronic resource] :cryostat design, material properties, and superconductor critical-current testing /
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cryostat design, material properties, and superconductor critical-current testing /
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Jack W. Ekin.
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http://dx.doi.org/10.1093/acprof:oso/9780198570547.001.0001
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