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High resolution X-ray diffractometry...

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Bowen, D. Keith (1940-)

High resolution X-ray diffractometry and topography

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	548.83
書名/作者:	High resolution X-ray diffractometry and topography/ D. Keith Bowen and Brian K. Tanner.
作者:	Bowen, D. Keith
其他作者:	Tanner, B. K.
出版者:	London : Taylor & Francis, 1998.
面頁冊數:	x, 252 p. : ill.; 28 cm.
標題:	X-ray crystallography.
標題:	X-rays - Diffraction.
標題:	Crystals.
ISBN:	0850667585
書目註:	Includes bibliographical references and index.
電子資源:	http://www.loc.gov/catdir/enhancements/fy0731/98136331-d.html

High resolution X-ray diffractometry and topography
Bowen, D. Keith1940-

High resolution X-ray diffractometry and topographyD. Keith Bowen and Brian K. Tanner. - LondonTaylor & Francis1998. - x, 252 p.ill.28 cm.

Includes bibliographical references and index.

ISBN: 0850667585NTD 4,601Subjects--Topical Terms:

337912
X-ray crystallography.

Dewey Class. No.: 548.83

High resolution X-ray diffractometry and topography
LDR:00492cam 2200121 a 4500 001 322355
008 100916s1998 enka b 001 0 eng d
020 $a 0850667585 $c NTD 4,601
082 0 0 $a 548.83
100 1 $a Bowen, D. Keith $q (David Keith), $d 1940- $3 337910
245 1 0 $a High resolution X-ray diffractometry and topography $c D. Keith Bowen and Brian K. Tanner.
260 # $a London $a Bristol, PA $b Taylor & Francis $c 1998.
300 $a x, 252 p. $b ill. $c 28 cm.
504 $a Includes bibliographical references and index.
650 # 0 $a X-ray crystallography. $3 337912
650 # 0 $a X-rays $x Diffraction. $3 337913
650 # 0 $a Crystals. $3 183911
700 1 # $a Tanner, B. K. $q (Brian Keith) $3 337911
856 4 2 $3 Publisher description $u http://www.loc.gov/catdir/enhancements/fy0731/98136331-d.html

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