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Semiconductor material and device ch...

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SchroderDieter K.ed.

Semiconductor material and device characterization

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
書名/作者:	Semiconductor material and device characterization/ Schroder,Dieter K.ed.
作者:	SchroderDieter K.ed.
出版者:	New York : John Wiley & Sons, 1998
面頁冊數:	760頁; 25x17公分
附註:	INCLUDES BIBLIOGRAPHICAL REFERENCES AND INDEX.
標題:	Semiconductors.
標題:	Semiconductiors-Testing.
ISBN:	0471241393(精裝)

Semiconductor material and device characterization
SchroderDieter K.ed.

Semiconductor material and device characterizationSchroder,Dieter K.ed. - 2ND ED. - New YorkJohn Wiley & Sons1998 - 760頁25x17公分

INCLUDES BIBLIOGRAPHICAL REFERENCES AND INDEX.

ISBN: 0471241393(精裝)Subjects--Topical Terms:

175080
Semiconductors.

Semiconductor material and device characterization
LDR:00446nam 2200157 450 001 174895
008 100623t1998 us a a 000 0 eng d
020 $a 0471241393(精裝)
035 $a 9115577
040 $b eng $c DYU
041 $a eng
044 $a us
100 $a SchroderDieter K.ed. $3 183445
245 1 0 $a Semiconductor material and device characterization $c Schroder,Dieter K.ed.
250 $a 2ND ED.
260 $a New York $b John Wiley & Sons $c 1998
300 $a 760頁 $c 25x17公分
500 $a INCLUDES BIBLIOGRAPHICAL REFERENCES AND INDEX.
650 $a Semiconductors. $3 175080
650 $a Semiconductiors-Testing. $3 183446

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