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Voigtlander, Bert.

Overview

Works:	1 works in 1 publications in 1 languages

Titles

Scanning probe microscopy[electronic resource] :atomic force microscopy and scanning tunneling microscopy / by: SpringerLink (Online service); Voigtlander, Bert. (Language materials, printed)

Subjects

Nanotechnology. Condensed Matter Physics. Atomic force microscopy. Materials Science. Nanotechnology and Microengineering. Scanning probe microscopy. Scanning tunneling microscopy.

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