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CMOS RF circuit design for reliabili...

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CMOS RF circuit design for reliability and variability[electronic resource] /

レコード種別:	言語・文字資料 (印刷物) : 単行資料
[NT 15000414] null:	621.3815
タイトル / 著者:	CMOS RF circuit design for reliability and variability/ by Jiann-Shiun Yuan.
著者:	Yuan, Jiann-Shiun.
出版された:	Singapore : : Springer Singapore :, 2016.
記述:	vi, 106 p. : : ill., digital ;; 24 cm.
含まれています:	Springer eBooks
主題:	Radio frequency integrated circuits - Design and construction.
主題:	Metal oxide semiconductors, Complementary - Design and construction.
主題:	Engineering.
主題:	Circuits and Systems.
主題:	Electronic Circuits and Devices.
主題:	Microwaves, RF and Optical Engineering.
国際標準図書番号 (ISBN) :	9789811008849
国際標準図書番号 (ISBN) :	9789811008825
[NT 15000228] null:	CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.
[NT 15000229] null:	The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
電子資源:	http://dx.doi.org/10.1007/978-981-10-0884-9

CMOS RF circuit design for reliability and variability[electronic resource] /
Yuan, Jiann-Shiun.

CMOS RF circuit design for reliability and variability[electronic resource] /by Jiann-Shiun Yuan. - Singapore :Springer Singapore :2016. - vi, 106 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology,2191-530X. - SpringerBriefs in applied sciences and technology..

CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

ISBN: 9789811008849

Standard No.: 10.1007/978-981-10-0884-9doiSubjects--Topical Terms:

481204
Radio frequency integrated circuits
--Design and construction.

LC Class. No.: TK7874.78

Dewey Class. No.: 621.3815

CMOS RF circuit design for reliability and variability[electronic resource] /
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245 1 0 $a CMOS RF circuit design for reliability and variability $h [electronic resource] / $c by Jiann-Shiun Yuan.
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490 1 $a SpringerBriefs in applied sciences and technology, $x 2191-530X
505 0 $a CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.
520 $a The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
650 0 $a Radio frequency integrated circuits $x Design and construction. $3 481204
650 0 $a Metal oxide semiconductors, Complementary $x Design and construction. $3 418300
650 1 4 $a Engineering. $3 372756
650 2 4 $a Circuits and Systems. $3 463473
650 2 4 $a Electronic Circuits and Devices. $3 463910
650 2 4 $a Microwaves, RF and Optical Engineering. $3 463864
710 2 $a SpringerLink (Online service) $3 463450
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830 0 $a SpringerBriefs in applied sciences and technology. $3 463858
856 4 0 $u http://dx.doi.org/10.1007/978-981-10-0884-9
950 $a Engineering (Springer-11647)

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