大葉大學圖書館 |

登入

回首頁

Frontiers in optical methods[electro...

Katayama, Ikufumui.

Frontiers in optical methods[electronic resource] :nano-characterization and coherent control /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	535.84
書名/作者:	Frontiers in optical methods : nano-characterization and coherent control // edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno.
其他作者:	Shudo, Ken-ichi.
出版者:	Berlin, Heidelberg : : Springer Berlin Heidelberg :, 2014.
面頁冊數:	xii, 228 p. : : ill. (some col.), digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Reflectance spectroscopy.
標題:	Terahertz spectroscopy.
標題:	Coherence (Optics)
標題:	Physics.
標題:	Laser Technology, Photonics.
標題:	Atomic, Molecular, Optical and Plasma Physics.
標題:	Optics, Optoelectronics, Plasmonics and Optical Devices.
標題:	Spectroscopy and Microscopy.
標題:	Microwaves, RF and Optical Engineering.
標題:	Nanotechnology.
ISBN:	9783642405945 (electronic bk.)
ISBN:	9783642405938 (paper)
電子資源:	http://dx.doi.org/10.1007/978-3-642-40594-5

Frontiers in optical methods[electronic resource] :nano-characterization and coherent control /
Frontiers in optical methodsnano-characterization and coherent control /[electronic resource] :edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno. - Berlin, Heidelberg :Springer Berlin Heidelberg :2014. - xii, 228 p. :ill. (some col.), digital ;24 cm. - Springer series in optical sciences,v.1800342-4111 ;. - Springer series in optical sciences ;164..

ISBN: 9783642405945 (electronic bk.)Subjects--Topical Terms:

614450
Reflectance spectroscopy.

Dewey Class. No.: 535.84

Frontiers in optical methods[electronic resource] :nano-characterization and coherent control /
LDR:00920nam a2200253 a 4500 001 430668
003 DE-He213
005 20140704160841.0
006 m d
007 cr nn 008maaau
008 160104s2014 gw s 0 eng d
020 $a 9783642405945 (electronic bk.)
020 $a 9783642405938 (paper)
035 $a 978-3-642-40594-5
040 $a GP $c GP
041 0 $a eng
082 0 4 $a 535.84 $2 23
090 $a QC454.R4 $b F935 2014
245 0 0 $a Frontiers in optical methods $h [electronic resource] : $b nano-characterization and coherent control / $c edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno.
260 $a Berlin, Heidelberg : $b Springer Berlin Heidelberg : $b Imprint: Springer, $c 2014.
300 $a xii, 228 p. : $b ill. (some col.), digital ; $c 24 cm.
490 1 $a Springer series in optical sciences, $x 0342-4111 ; $v v.180
650 0 $a Reflectance spectroscopy. $3 614450
650 0 $a Terahertz spectroscopy. $3 487647
650 0 $a Coherence (Optics) $3 612532
650 1 4 $a Physics. $3 171863
650 2 4 $a Laser Technology, Photonics. $3 464660
650 2 4 $a Atomic, Molecular, Optical and Plasma Physics. $3 464263
650 2 4 $a Optics, Optoelectronics, Plasmonics and Optical Devices. $3 464661
650 2 4 $a Spectroscopy and Microscopy. $3 463786
650 2 4 $a Microwaves, RF and Optical Engineering. $3 463864
650 2 4 $a Nanotechnology. $3 192698
700 1 $a Shudo, Ken-ichi. $3 614447
700 1 $a Katayama, Ikufumui. $3 614448
700 1 $a Ohno, Shin-Ya. $3 614449
710 2 $a SpringerLink (Online service) $3 463450
773 0 $t Springer eBooks
830 0 $a Springer series in optical sciences ; $v 164. $3 467756
856 4 0 $u http://dx.doi.org/10.1007/978-3-642-40594-5
950 $a Physics and Astronomy (Springer-11651)

筆 0 讀者評論

多媒體

多媒體檔案
http://dx.doi.org/10.1007/978-3-642-40594-5

評論

新增評論分享你的心得

Export

取書館別