Stochastic modeling of thermal fatig...
Radu, Vasile.

 

  • Stochastic modeling of thermal fatigue crack growth[electronic resource] /
  • 紀錄類型: 書目-語言資料,印刷品 : Monograph/item
    杜威分類號: 620.1121
    書名/作者: Stochastic modeling of thermal fatigue crack growth/ by Vasile Radu.
    作者: Radu, Vasile.
    出版者: Cham : : Springer International Publishing :, 2015.
    面頁冊數: xiv, 90 p. : : ill., digital ;; 24 cm.
    Contained By: Springer eBooks
    標題: Thermal stresses.
    標題: Stochastic models.
    標題: Engineering.
    標題: Continuum Mechanics and Mechanics of Materials.
    標題: Industrial and Production Engineering.
    標題: Nuclear Engineering.
    標題: Structural Materials.
    ISBN: 9783319128771 (electronic bk.)
    ISBN: 9783319128764 (paper)
    內容註: Introduction -- Background on stochastic models for cumulative damage process -- Basic mathematical tools for stochastic fatigue analysis -- Stochastic model for thermal fatigue crack growth -- Application -- Conclusions.
    摘要、提要註: The book describes a systematic stochastic modeling approach for assessing thermal-fatigue crack-growth in mixing tees, based on the power spectral density of temperature fluctuation at the inner pipe surface. It shows the development of a frequency-temperature response function in the framework of single-input, single-output (SISO) methodology from random noise/signal theory under sinusoidal input. The frequency response of stress intensity factor (SIF) is obtained by a polynomial fitting procedure of thermal stress profiles at various instants of time. The method, which takes into account the variability of material properties, and has been implemented in a real-world application, estimates the probabilities of failure by considering a limit state function and Monte Carlo analysis, which are based on the proposed stochastic model. Written in a comprehensive and accessible style, this book presents a new and effective method for assessing thermal fatigue crack, and it is intended as a concise and practice-oriented guide for all undergraduate students, young scientists and researchers dealing with probabilistic assessment of structural integrity.
    電子資源: http://dx.doi.org/10.1007/978-3-319-12877-1
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