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Stochastic modeling of thermal fatig...
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Radu, Vasile.
Stochastic modeling of thermal fatigue crack growth[electronic resource] /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
620.1121
書名/作者:
Stochastic modeling of thermal fatigue crack growth/ by Vasile Radu.
作者:
Radu, Vasile.
出版者:
Cham : : Springer International Publishing :, 2015.
面頁冊數:
xiv, 90 p. : : ill., digital ;; 24 cm.
Contained By:
Springer eBooks
標題:
Thermal stresses.
標題:
Stochastic models.
標題:
Engineering.
標題:
Continuum Mechanics and Mechanics of Materials.
標題:
Industrial and Production Engineering.
標題:
Nuclear Engineering.
標題:
Structural Materials.
ISBN:
9783319128771 (electronic bk.)
ISBN:
9783319128764 (paper)
內容註:
Introduction -- Background on stochastic models for cumulative damage process -- Basic mathematical tools for stochastic fatigue analysis -- Stochastic model for thermal fatigue crack growth -- Application -- Conclusions.
摘要、提要註:
The book describes a systematic stochastic modeling approach for assessing thermal-fatigue crack-growth in mixing tees, based on the power spectral density of temperature fluctuation at the inner pipe surface. It shows the development of a frequency-temperature response function in the framework of single-input, single-output (SISO) methodology from random noise/signal theory under sinusoidal input. The frequency response of stress intensity factor (SIF) is obtained by a polynomial fitting procedure of thermal stress profiles at various instants of time. The method, which takes into account the variability of material properties, and has been implemented in a real-world application, estimates the probabilities of failure by considering a limit state function and Monte Carlo analysis, which are based on the proposed stochastic model. Written in a comprehensive and accessible style, this book presents a new and effective method for assessing thermal fatigue crack, and it is intended as a concise and practice-oriented guide for all undergraduate students, young scientists and researchers dealing with probabilistic assessment of structural integrity.
電子資源:
http://dx.doi.org/10.1007/978-3-319-12877-1
Stochastic modeling of thermal fatigue crack growth[electronic resource] /
Radu, Vasile.
Stochastic modeling of thermal fatigue crack growth
[electronic resource] /by Vasile Radu. - Cham :Springer International Publishing :2015. - xiv, 90 p. :ill., digital ;24 cm. - Applied condition monitoring,v.12363-698X ;. - Applied condition monitoring ;v.1..
Introduction -- Background on stochastic models for cumulative damage process -- Basic mathematical tools for stochastic fatigue analysis -- Stochastic model for thermal fatigue crack growth -- Application -- Conclusions.
The book describes a systematic stochastic modeling approach for assessing thermal-fatigue crack-growth in mixing tees, based on the power spectral density of temperature fluctuation at the inner pipe surface. It shows the development of a frequency-temperature response function in the framework of single-input, single-output (SISO) methodology from random noise/signal theory under sinusoidal input. The frequency response of stress intensity factor (SIF) is obtained by a polynomial fitting procedure of thermal stress profiles at various instants of time. The method, which takes into account the variability of material properties, and has been implemented in a real-world application, estimates the probabilities of failure by considering a limit state function and Monte Carlo analysis, which are based on the proposed stochastic model. Written in a comprehensive and accessible style, this book presents a new and effective method for assessing thermal fatigue crack, and it is intended as a concise and practice-oriented guide for all undergraduate students, young scientists and researchers dealing with probabilistic assessment of structural integrity.
ISBN: 9783319128771 (electronic bk.)
Standard No.: 10.1007/978-3-319-12877-1doiSubjects--Topical Terms:
336771
Thermal stresses.
LC Class. No.: TA418.58
Dewey Class. No.: 620.1121
Stochastic modeling of thermal fatigue crack growth[electronic resource] /
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