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Diagnostic test approaches to machin...
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IGI Global.
Diagnostic test approaches to machine learning and commonsense reasoning systems[electronic resource] /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
006.3/12
書名/作者:
Diagnostic test approaches to machine learning and commonsense reasoning systems/ Xenia Naidenova and Dmitry I. Ignatov, editors.
其他作者:
Naidenova, Xenia,
出版者:
Hershey, Pa. : : IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA),, c2013.
面頁冊數:
269 p. ;; 29 cm.
標題:
Machine learning.
標題:
Data mining.
標題:
Pattern recognition systems.
標題:
Computer algorithms.
ISBN:
9781466619012 (ebook)
ISBN:
9781466619005 (hardcover)
ISBN:
9781466619029 (print & perpetual access)
書目註:
Includes bibliographical references.
電子資源:
http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-4666-1900-5
Diagnostic test approaches to machine learning and commonsense reasoning systems[electronic resource] /
Diagnostic test approaches to machine learning and commonsense reasoning systems
[electronic resource] /Xenia Naidenova and Dmitry I. Ignatov, editors. - Hershey, Pa. :IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA),c2013. - 269 p. ;29 cm.
Includes bibliographical references.
Mode of access: World Wide Web.
ISBN: 9781466619012 (ebook)Subjects--Topical Terms:
202931
Machine learning.
LC Class. No.: Q325.5 / .D53 2013e
Dewey Class. No.: 006.3/12
Diagnostic test approaches to machine learning and commonsense reasoning systems[electronic resource] /
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http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-4666-1900-5
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