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Statistical performance analysis and...

Shen, Ruijing.

Statistical performance analysis and modeling techniques for nanometer VLSI designs[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.395
書名/作者:	Statistical performance analysis and modeling techniques for nanometer VLSI designs/ by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu.
作者:	Shen, Ruijing.
其他作者:	Tan, Sheldon X.-D.
出版者:	Boston, MA : : Springer US,, 2012.
面頁冊數:	xxix, 305 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Integrated circuits - Very large scale integration
標題:	Engineering.
標題:	Circuits and Systems.
標題:	Computer-Aided Engineering (CAD, CAE) and Design.
標題:	Nanotechnology and Microengineering.
ISBN:	9781461407881 (electronic bk.)
ISBN:	9781461407874 (paper)
電子資源:	http://dx.doi.org/10.1007/978-1-4614-0788-1

Statistical performance analysis and modeling techniques for nanometer VLSI designs[electronic resource] /
Shen, Ruijing.

Statistical performance analysis and modeling techniques for nanometer VLSI designs[electronic resource] /by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu. - Boston, MA :Springer US,2012. - xxix, 305 p. :ill., digital ;24 cm.

ISBN: 9781461407881 (electronic bk.)Subjects--Topical Terms:

464665
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874.75 / .S54 2012

Dewey Class. No.: 621.395

Statistical performance analysis and modeling techniques for nanometer VLSI designs[electronic resource] /
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