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High quality test pattern generation...

Drechsler, Rolf.

High quality test pattern generation and boolean satisfiability[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.395
書名/作者:	High quality test pattern generation and boolean satisfiability/ by Stephan EggersgluB, Rolf Drechsler.
作者:	Eggersgluss, Stephan.
其他作者:	Drechsler, Rolf.
出版者:	Boston, MA : : Springer US,, 2012.
面頁冊數:	xviii, 193 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Integrated circuits - Testing.
標題:	Algebra, Boolean.
標題:	Engineering.
標題:	Circuits and Systems.
標題:	Electronics and Microelectronics, Instrumentation.
標題:	Processor Architectures.
ISBN:	9781441999764 (electronic bk.)
ISBN:	9781441999757 (paper)
電子資源:	http://dx.doi.org/10.1007/978-1-4419-9976-4

High quality test pattern generation and boolean satisfiability[electronic resource] /
Eggersgluss, Stephan.

High quality test pattern generation and boolean satisfiability[electronic resource] /by Stephan EggersgluB, Rolf Drechsler. - Boston, MA :Springer US,2012. - xviii, 193 p. :ill., digital ;24 cm.

ISBN: 9781441999764 (electronic bk.)Subjects--Topical Terms:

467165
Integrated circuits
--Testing.

LC Class. No.: TK7874 / .E34 2012

Dewey Class. No.: 621.395

High quality test pattern generation and boolean satisfiability[electronic resource] /
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