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Spectroscopic ellipsometry :practica...
~
Hilfiker, James N.
Spectroscopic ellipsometry :practical application to thin film characterization /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
620.1/1295
書名/作者:
Spectroscopic ellipsometry : : practical application to thin film characterization // Harland G. Tompkins and James N. Hilfiker.
作者:
Tompkins, Harland G.
其他作者:
Hilfiker, James N.
出版者:
New York : : Momentum Press,, c2016.
面頁冊數:
xxiii, 159 p. : : ill. ;; 23 cm.
標題:
Ellipsometry.
標題:
Thin films - Measurement.
標題:
Spectrum analysis - Measurement.
ISBN:
9781606507278 (pbk.) :
書目註:
Includes bibliographical references (p. [151]-154) and index.
Spectroscopic ellipsometry :practical application to thin film characterization /
Tompkins, Harland G.
Spectroscopic ellipsometry :
practical application to thin film characterization /Harland G. Tompkins and James N. Hilfiker. - New York :Momentum Press,c2016. - xxiii, 159 p. :ill. ;23 cm. - Materials characterization and analysis collection,2377-4347. - Materials characterization and analysis collection..
Includes bibliographical references (p. [151]-154) and index.
ISBN: 9781606507278 (pbk.) :NTD 1,573Subjects--Topical Terms:
611825
Ellipsometry.
LC Class. No.: QC443 / .T647 2016
Dewey Class. No.: 620.1/1295
Spectroscopic ellipsometry :practical application to thin film characterization /
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