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Structural, syntactic, and statistical pattern recognition[electronic resource] :Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	006.4
書名/作者:	Structural, syntactic, and statistical pattern recognition : Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings // edited by Antonio Robles-Kelly ... [et al.].
其他題名:	S+SSPR 2016
其他作者:	Robles-Kelly, Antonio.
出版者:	Cham : : Springer International Publishing :, 2016.
面頁冊數:	xiii, 588 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Pattern recognition systems
標題:	Computer Science.
標題:	Artificial Intelligence (incl. Robotics)
標題:	Pattern Recognition.
標題:	Information Systems Applications (incl. Internet)
標題:	Database Management.
標題:	Algorithm Analysis and Problem Complexity.
標題:	Data Mining and Knowledge Discovery.
ISBN:	9783319490557
ISBN:	9783319490540
內容註:	Dimensionality reduction -- Manifold learning and embedding methods -- Dissimilarity representations -- Graph-theoretic methods -- Model selection, classification and clustering -- Semi and fully supervised learning methods -- Shape analysis -- Spatio-temporal pattern recognition -- Structural matching -- Text and document analysis.
摘要、提要註:	This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.
電子資源:	http://dx.doi.org/10.1007/978-3-319-49055-7

Structural, syntactic, and statistical pattern recognition[electronic resource] :Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /
Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /[electronic resource] :S+SSPR 2016edited by Antonio Robles-Kelly ... [et al.]. - Cham :Springer International Publishing :2016. - xiii, 588 p. :ill., digital ;24 cm. - Lecture notes in computer science,100290302-9743 ;. - Lecture notes in computer science ;7103..

Dimensionality reduction -- Manifold learning and embedding methods -- Dissimilarity representations -- Graph-theoretic methods -- Model selection, classification and clustering -- Semi and fully supervised learning methods -- Shape analysis -- Spatio-temporal pattern recognition -- Structural matching -- Text and document analysis.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.

ISBN: 9783319490557

Standard No.: 10.1007/978-3-319-49055-7doiSubjects--Topical Terms:

135230
Pattern recognition systems

LC Class. No.: TK7882.P3

Dewey Class. No.: 006.4

Structural, syntactic, and statistical pattern recognition[electronic resource] :Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /
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