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Physical principles of electron microscopy[electronic resource] :an introduction to TEM, SEM, and AEM /

紀錄類型:	書目-電子資源 : Monograph/item
杜威分類號:	502.825
書名/作者:	Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM // by R.F. Egerton.
作者:	Egerton, R.F.
出版者:	Cham : : Springer International Publishing :, 2016.
面頁冊數:	xi, 196 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Electron microscopy.
標題:	Materials Science.
標題:	Characterization and Evaluation of Materials.
標題:	Spectroscopy and Microscopy.
標題:	Biological Microscopy.
標題:	Nanotechnology.
ISBN:	9783319398778
ISBN:	9783319398761
內容註:	An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations.
摘要、提要註:	This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
電子資源:	http://dx.doi.org/10.1007/978-3-319-39877-8

Physical principles of electron microscopy[electronic resource] :an introduction to TEM, SEM, and AEM /
Egerton, R.F.

Physical principles of electron microscopyan introduction to TEM, SEM, and AEM /[electronic resource] :by R.F. Egerton. - 2nd ed. - Cham :Springer International Publishing :2016. - xi, 196 p. :ill., digital ;24 cm.

An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations.

This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.

ISBN: 9783319398778

Standard No.: 10.1007/978-3-319-39877-8doiSubjects--Topical Terms:

386317
Electron microscopy.

LC Class. No.: QH212.E4 / E354 2016

Dewey Class. No.: 502.825

Physical principles of electron microscopy[electronic resource] :an introduction to TEM, SEM, and AEM /
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