X-ray scattering from semiconductors...
Fewster, Paul F.

 

  • X-ray scattering from semiconductors and other materials[electronic resource] /
  • 紀錄類型: 書目-語言資料,印刷品 : Monograph/item
    杜威分類號: 537.5/35
    書名/作者: X-ray scattering from semiconductors and other materials/ Paul F. Fewster.
    作者: Fewster, Paul F.
    出版者: New Jersey : : World Scientific,, 2015.
    面頁冊數: 1 online resource (xvi, 493 p.) : : ill.
    標題: X-rays - Scattering.
    標題: Semiconductors.
    ISBN: 9789814436939 (electronic bk.)
    書目註: Includes bibliographical references (p. 475-476) and index.
    內容註: An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.
    電子資源: http://www.worldscientific.com/worldscibooks/10.1142/8648#t=toc
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