大葉大學圖書館 |

Soft error mechanisms, modeling and mitigation[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	005.717
書名/作者:	Soft error mechanisms, modeling and mitigation/ by Selahattin Sayil.
作者:	Sayil, Selahattin.
出版者:	Cham : : Springer International Publishing :, 2016.
面頁冊數:	xi, 105 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Soft errors (Computer science)
標題:	Error-correcting codes (Information theory) - Congresses.
標題:	Engineering.
標題:	Circuits and Systems.
標題:	Electronic Circuits and Devices.
標題:	Processor Architectures.
ISBN:	9783319306070
ISBN:	9783319306063
內容註:	Introduction -- Mitigation of Single Event Effects -- Transmission Gate (TG) Based Soft Error Mitigation Methods -- Single Event Soft Error Mechanisms -- Modeling Single Event Crosstalk Noise in Nanometer Technologies -- Modeling of Single Event Coupling Delay and Speedup Effects -- Single Event Upset Hardening of Interconnects -- Soft-Error Aware Power Optimization -- Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.
摘要、提要註:	This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
電子資源:	http://dx.doi.org/10.1007/978-3-319-30607-0

Soft error mechanisms, modeling and mitigation[electronic resource] /
Sayil, Selahattin.

Soft error mechanisms, modeling and mitigation[electronic resource] /by Selahattin Sayil. - Cham :Springer International Publishing :2016. - xi, 105 p. :ill., digital ;24 cm.

Introduction -- Mitigation of Single Event Effects -- Transmission Gate (TG) Based Soft Error Mitigation Methods -- Single Event Soft Error Mechanisms -- Modeling Single Event Crosstalk Noise in Nanometer Technologies -- Modeling of Single Event Coupling Delay and Speedup Effects -- Single Event Upset Hardening of Interconnects -- Soft-Error Aware Power Optimization -- Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

ISBN: 9783319306070

Standard No.: 10.1007/978-3-319-30607-0doiSubjects--Topical Terms:

656295
Soft errors (Computer science)

LC Class. No.: TK5102.96

Dewey Class. No.: 005.717

Soft error mechanisms, modeling and mitigation[electronic resource] /
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505 0 $a Introduction -- Mitigation of Single Event Effects -- Transmission Gate (TG) Based Soft Error Mitigation Methods -- Single Event Soft Error Mechanisms -- Modeling Single Event Crosstalk Noise in Nanometer Technologies -- Modeling of Single Event Coupling Delay and Speedup Effects -- Single Event Upset Hardening of Interconnects -- Soft-Error Aware Power Optimization -- Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.
520 $a This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
650 0 $a Soft errors (Computer science) $3 656295
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650 1 4 $a Engineering. $3 372756
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650 2 4 $a Processor Architectures. $3 463933
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