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The boundary-scan handbook[electroni...

Parker, Kenneth P.

The boundary-scan handbook[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.3815310218
書名/作者:	The boundary-scan handbook/ by Kenneth P. Parker.
作者:	Parker, Kenneth P.
出版者:	Cham : : Springer International Publishing :, 2016.
面頁冊數:	xxxiv, 552 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Printed circuits - Testing.
標題:	Printed circuits - Testing
標題:	Boundary scan testing.
標題:	Electronic digital computers - Circuits
標題:	Engineering.
標題:	Circuits and Systems.
標題:	Processor Architectures.
標題:	Semiconductors.
ISBN:	9783319011745
ISBN:	9783319011738
內容註:	Boundary-Scan Basics And Vocabulary -- Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan -- IEEE 1149.6 Testing Advanced I/O -- IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision -- IEEE 1149.6: The 2015 Revision.
電子資源:	http://dx.doi.org/10.1007/978-3-319-01174-5

The boundary-scan handbook[electronic resource] /
Parker, Kenneth P.

The boundary-scan handbook[electronic resource] /by Kenneth P. Parker. - 4th ed. - Cham :Springer International Publishing :2016. - xxxiv, 552 p. :ill., digital ;24 cm.

Boundary-Scan Basics And Vocabulary -- Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan -- IEEE 1149.6 Testing Advanced I/O -- IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision -- IEEE 1149.6: The 2015 Revision.

ISBN: 9783319011745

Standard No.: 10.1007/978-3-319-01174-5doiSubjects--Topical Terms:

652745
Printed circuits
--Testing.

LC Class. No.: TK7868.P7

Dewey Class. No.: 621.3815310218

The boundary-scan handbook[electronic resource] /
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