大葉大學圖書館 |

言語: 日文

Characterization of high Tc material...

Browning, Nigel D.,

Characterization of high Tc materials and devices by electron microscopy /

レコード種別:	言語・文字資料 (印刷物) : 単行資料
[NT 15000414] null:	537.6/23/0284
タイトル / 著者:	Characterization of high Tc materials and devices by electron microscopy // edited by Nigel D. Browning, Stephen J. Pennycook.
その他のタイトル:	Characterization of High Tc Materials & Devices by Electron Microscopy
その他の著者:	Browning, Nigel D.,
記述:	1 online resource (xii, 391 pages) : : digital, PDF file(s).
注記:	Title from publisher's bibliographic system (viewed on 05 Oct 2015).
主題:	High temperature superconductors.
主題:	Electron microscopy - Technique.
国際標準図書番号 (ISBN) :	9780511534829 (ebook)
[NT 15000229] null:	This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
電子資源:	http://dx.doi.org/10.1017/CBO9780511534829

Characterization of high Tc materials and devices by electron microscopy /
Characterization of high Tc materials and devices by electron microscopy /Characterization of High Tc Materials & Devices by Electron Microscopyedited by Nigel D. Browning, Stephen J. Pennycook. - 1 online resource (xii, 391 pages) :digital, PDF file(s).

Title from publisher's bibliographic system (viewed on 05 Oct 2015).

High-resolution transmission electron microscopy /S. Horiuchi and L. He --1.

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

ISBN: 9780511534829 (ebook)Subjects--Topical Terms:

512091
High temperature superconductors.

LC Class. No.: QC611.98.H54 / C43 2000

Dewey Class. No.: 537.6/23/0284

Characterization of high Tc materials and devices by electron microscopy /
LDR:03038nam a22003138i 4500 001 449232
003 UkCbUP
005 20151005020621.0
006 m|||||o||d||||||||
007 cr||||||||||||
008 161201s2000||||enk o ||1 0|eng|d
020 $a 9780511534829 (ebook)
020 $z 9780521554909 (hardback)
020 $z 9780521031707 (paperback)
035 $a CR9780511534829
040 $a UkCbUP $b eng $e rda $c UkCbUP
050 0 0 $a QC611.98.H54 $b C43 2000
082 0 0 $a 537.6/23/0284 $2 21
245 0 0 $a Characterization of high Tc materials and devices by electron microscopy / $c edited by Nigel D. Browning, Stephen J. Pennycook.
246 3 $a Characterization of High Tc Materials & Devices by Electron Microscopy
264 1 $a Cambridge : $b Cambridge University Press, $c 2000.
300 $a 1 online resource (xii, 391 pages) : $b digital, PDF file(s).
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
500 $a Title from publisher's bibliographic system (viewed on 05 Oct 2015).
505 0 0 $g 1. $t High-resolution transmission electron microscopy / $r S. Horiuchi and L. He -- $g 2. $t Holography in the transmission electron microscope / $r A. Tonomura -- $g 3. $t Microanalysis by scanning transmission electron microscopy / $r L.M. Brown and J. Yuan -- $g 4. $t Specimen preparation for transmission electron microscopy / $r J.G. Wen -- $g 5. $t Low-temperature scanning electron microscopy / $r R.P. Huebener -- $g 6. $t Scanning tunneling microscopy / $r M.E. Hawley -- $g 7. $t Identification of new superconducting compounds by electron microscopy / $r G. Van Tendeloo and T. Krekels -- $g 8. $t Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / $r Y.Y. Wang and V.P. Dravid.
520 $a This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
650 0 $a High temperature superconductors. $3 512091
650 0 $a Electron microscopy $x Technique. $3 493104
700 1 $a Browning, Nigel D., $e editor. $3 644667
700 1 $a Pennycook, Stephen J., $e editor. $3 644668
776 0 8 $i Print version: $z 9780521554909
856 4 0 $u http://dx.doi.org/10.1017/CBO9780511534829

～に基づいて 0 論評

マルチメディア (複合媒体資料)

マルチメディアファイル
http://dx.doi.org/10.1017/CBO9780511534829

論評

論評を追加あなたの考えを共有してください。

Export

受取館