大葉大學圖書館 |

CMOS RF circuit design for reliability and variability[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.3815
書名/作者:	CMOS RF circuit design for reliability and variability/ by Jiann-Shiun Yuan.
作者:	Yuan, Jiann-Shiun.
出版者:	Singapore : : Springer Singapore :, 2016.
面頁冊數:	vi, 106 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Radio frequency integrated circuits - Design and construction.
標題:	Metal oxide semiconductors, Complementary - Design and construction.
標題:	Engineering.
標題:	Circuits and Systems.
標題:	Electronic Circuits and Devices.
標題:	Microwaves, RF and Optical Engineering.
ISBN:	9789811008849
ISBN:	9789811008825
內容註:	CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.
摘要、提要註:	The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
電子資源:	http://dx.doi.org/10.1007/978-981-10-0884-9

CMOS RF circuit design for reliability and variability[electronic resource] /
Yuan, Jiann-Shiun.

CMOS RF circuit design for reliability and variability[electronic resource] /by Jiann-Shiun Yuan. - Singapore :Springer Singapore :2016. - vi, 106 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology,2191-530X. - SpringerBriefs in applied sciences and technology..

CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

ISBN: 9789811008849

Standard No.: 10.1007/978-981-10-0884-9doiSubjects--Topical Terms:

481204
Radio frequency integrated circuits
--Design and construction.

LC Class. No.: TK7874.78

Dewey Class. No.: 621.3815

CMOS RF circuit design for reliability and variability[electronic resource] /
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520 $a The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
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