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Materials characterization[electroni...

Leng, Y.

Materials characterization[electronic resource] :introduction to microscopic and spectroscopic methods /

Record Type:	Language materials, printed : Monograph/item
[NT 15000414]:	620.11
Title/Author:	Materials characterization : introduction to microscopic and spectroscopic methods // Yang Leng.
Author:	Leng, Y.
Published:	Weinheim, Germany : : Wiley-VCH,, c2013.
Description:	1 online resource (xiv, 376 p.)
Subject:	Materials.
Subject:	Materials - Analysis.
ISBN:	9783527670772 (electronic bk.)
ISBN:	3527670777 (electronic bk.)
ISBN:	9783527670802 (electronic bk.)
ISBN:	3527670807 (electronic bk.)
[NT 15000227]:	Includes bibliographical references and index.
[NT 15000228]:	Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
[NT 15000229]:	Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
Online resource:	http://onlinelibrary.wiley.com/book/10.1002/9783527670772

Materials characterization[electronic resource] :introduction to microscopic and spectroscopic methods /
Leng, Y.

Materials characterizationintroduction to microscopic and spectroscopic methods /[electronic resource] :Yang Leng. - 2nd ed. - Weinheim, Germany :Wiley-VCH,c2013. - 1 online resource (xiv, 376 p.)

Includes bibliographical references and index.

Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).

ISBN: 9783527670772 (electronic bk.)Subjects--Topical Terms:

183582
Materials.

LC Class. No.: TA403 / .L433 2013

Dewey Class. No.: 620.11

Materials characterization[electronic resource] :introduction to microscopic and spectroscopic methods /
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003 OCoLC
006 m o d
007 cr |||||||||||
008 160125s2013 gw ob 001 0 eng d
020 $a 9783527670772 (electronic bk.)
020 $a 3527670777 (electronic bk.)
020 $a 9783527670802 (electronic bk.)
020 $a 3527670807 (electronic bk.)
020 $z 9783527334636
035 $a ocn855504094
040 $a EBLCP $b eng $c EBLCP $d OCLCO $d DG1 $d YDXCP $d CUS $d N $d E7B
050 4 $a TA403 $b .L433 2013
082 0 4 $a 620.11
100 1 $a Leng, Y. $q (Yang) $3 519081
245 1 0 $a Materials characterization $h [electronic resource] : $b introduction to microscopic and spectroscopic methods / $c Yang Leng.
250 $a 2nd ed.
260 $a Weinheim, Germany : $b Wiley-VCH, $c c2013.
300 $a 1 online resource (xiv, 376 p.)
504 $a Includes bibliographical references and index.
505 0 $a Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
520 $a Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
588 $a Description based on online resource; title from PDF title page (Wiley, viewed August 22, 2013).
650 0 $a Materials. $3 183582
650 0 $a Materials $x Analysis. $3 518359
856 4 0 $u http://onlinelibrary.wiley.com/book/10.1002/9783527670772

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