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Bias temperature instability for dev...
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Grasser, Tibor.
Bias temperature instability for devices and circuits[electronic resource] /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
621.38152
書名/作者:
Bias temperature instability for devices and circuits/ edited by Tibor Grasser.
其他作者:
Grasser, Tibor.
出版者:
New York, NY : : Springer New York :, 2014.
面頁冊數:
xi, 810 p. : : ill., digital ;; 24 cm.
Contained By:
Springer eBooks
標題:
Metal oxide semiconductor field-effect transistors.
標題:
Engineering.
標題:
Circuits and Systems.
標題:
Semiconductors.
標題:
Electronics and Microelectronics, Instrumentation.
標題:
Quality Control, Reliability, Safety and Risk.
ISBN:
9781461479093 (electronic bk.)
ISBN:
9781461479086 (paper)
電子資源:
http://dx.doi.org/10.1007/978-1-4614-7909-3
Bias temperature instability for devices and circuits[electronic resource] /
Bias temperature instability for devices and circuits
[electronic resource] /edited by Tibor Grasser. - New York, NY :Springer New York :2014. - xi, 810 p. :ill., digital ;24 cm.
ISBN: 9781461479093 (electronic bk.)Subjects--Topical Terms:
339142
Metal oxide semiconductor field-effect transistors.
Dewey Class. No.: 621.38152
Bias temperature instability for devices and circuits[electronic resource] /
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