大葉大學圖書館 |

登入

回首頁

Hot carrier degradation in semicondu...

Grasser, Tibor.

Hot carrier degradation in semiconductor devices[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	537.6226
書名/作者:	Hot carrier degradation in semiconductor devices/ edited by Tibor Grasser.
其他作者:	Grasser, Tibor.
出版者:	Cham : : Springer International Publishing :, 2015.
面頁冊數:	x, 517 p. : : ill. (some col.), digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Hot carriers.
標題:	Semiconductors.
標題:	Engineering.
標題:	Circuits and Systems.
標題:	Electronic Circuits and Devices.
標題:	Electronics and Microelectronics, Instrumentation.
ISBN:	9783319089942 (electronic bk.)
ISBN:	9783319089935 (paper)
內容註:	Part I: Beyond Lucky Electrons -- From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation -- The Energy Driven Hot Carrier Model -- Hot-Carrier Degradation in Decananometer -- Physics-based Modeling of Hot-carrier Degradation -- The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation -- Recovery from Hot Carrier Induced Degradation Through Temperature Treatment -- Characterization of MOSFET Interface States Using the Charge Pumping Technique -- Part II: CMOS and Beyond -- Channel Hot Carriers in SiGe and Ge pMOSFETs -- Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs -- Characterization and Modeling of High-Voltage LDMOS Transistors -- Compact modelling of the Hot-carrier Degradation of Integrated HV MOSFETs -- Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors.
電子資源:	http://dx.doi.org/10.1007/978-3-319-08994-2

Hot carrier degradation in semiconductor devices[electronic resource] /
Hot carrier degradation in semiconductor devices[electronic resource] /edited by Tibor Grasser. - Cham :Springer International Publishing :2015. - x, 517 p. :ill. (some col.), digital ;24 cm.

Part I: Beyond Lucky Electrons -- From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation -- The Energy Driven Hot Carrier Model -- Hot-Carrier Degradation in Decananometer -- Physics-based Modeling of Hot-carrier Degradation -- The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation -- Recovery from Hot Carrier Induced Degradation Through Temperature Treatment -- Characterization of MOSFET Interface States Using the Charge Pumping Technique -- Part II: CMOS and Beyond -- Channel Hot Carriers in SiGe and Ge pMOSFETs -- Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs -- Characterization and Modeling of High-Voltage LDMOS Transistors -- Compact modelling of the Hot-carrier Degradation of Integrated HV MOSFETs -- Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors.

ISBN: 9783319089942 (electronic bk.)

Standard No.: 10.1007/978-3-319-08994-2doiSubjects--Topical Terms:

603298
Hot carriers.

LC Class. No.: QC611.6.H67

Dewey Class. No.: 537.6226

Hot carrier degradation in semiconductor devices[electronic resource] /
LDR:01794nam a2200301 a 4500 001 424938
003 DE-He213
005 20150617104632.0
006 m d
007 cr nn 008maaau
008 151119s2015 gw s 0 eng d
020 $a 9783319089942 (electronic bk.)
020 $a 9783319089935 (paper)
024 7 $a 10.1007/978-3-319-08994-2 $2 doi
035 $a 978-3-319-08994-2
040 $a GP $c GP
041 0 $a eng
050 4 $a QC611.6.H67
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
082 0 4 $a 537.6226 $2 23
090 $a QC611.6.H67 $b H832 2015
245 0 0 $a Hot carrier degradation in semiconductor devices $h [electronic resource] / $c edited by Tibor Grasser.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2015.
300 $a x, 517 p. : $b ill. (some col.), digital ; $c 24 cm.
505 0 $a Part I: Beyond Lucky Electrons -- From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation -- The Energy Driven Hot Carrier Model -- Hot-Carrier Degradation in Decananometer -- Physics-based Modeling of Hot-carrier Degradation -- The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation -- Recovery from Hot Carrier Induced Degradation Through Temperature Treatment -- Characterization of MOSFET Interface States Using the Charge Pumping Technique -- Part II: CMOS and Beyond -- Channel Hot Carriers in SiGe and Ge pMOSFETs -- Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs -- Characterization and Modeling of High-Voltage LDMOS Transistors -- Compact modelling of the Hot-carrier Degradation of Integrated HV MOSFETs -- Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors.
650 0 $a Hot carriers. $3 603298
650 0 $a Semiconductors. $3 175080
650 1 4 $a Engineering. $3 372756
650 2 4 $a Circuits and Systems. $3 463473
650 2 4 $a Electronic Circuits and Devices. $3 463910
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 463474
700 1 $a Grasser, Tibor. $3 603297
710 2 $a SpringerLink (Online service) $3 463450
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-08994-2
950 $a Engineering (Springer-11647)

筆 0 讀者評論

多媒體

多媒體檔案
http://dx.doi.org/10.1007/978-3-319-08994-2

評論

新增評論分享你的心得

Export

取書館別