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Reliability and radiation effects in...

Johnston, Allan

Reliability and radiation effects in compound semiconductors[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.38152
書名/作者:	Reliability and radiation effects in compound semiconductors/ Allan Johnston.
作者:	Johnston, Allan
出版者:	Singapore ; : World Scientific Pub. Co.,, c2010.
面頁冊數:	xii, 363 p. : : ill.
標題:	Compound semiconductors - Reliability.
標題:	Compound semiconductors - Effect of radiation on.
ISBN:	9789814277112 (electronic bk.)
書目註:	Includes bibliographical references and index.
電子資源:	http://www.worldscientific.com/worldscibooks/10.1142/7331#t=toc

Reliability and radiation effects in compound semiconductors[electronic resource] /
Johnston, Allan

Reliability and radiation effects in compound semiconductors[electronic resource] /Allan Johnston. - Singapore ;World Scientific Pub. Co.,c2010. - xii, 363 p. :ill.

Includes bibliographical references and index.

Electronic reproduction.
Singapore :
World Scientific Publishing Co.,
2010.

System requirements: Adobe Acrobat Reader.

ISBN: 9789814277112 (electronic bk.)Subjects--Topical Terms:

486793
Compound semiconductors
--Reliability.

LC Class. No.: TK7871.99.C65

Dewey Class. No.: 621.38152

Reliability and radiation effects in compound semiconductors[electronic resource] /
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300 $a xii, 363 p. : $b ill.
504 $a Includes bibliographical references and index.
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650 0 $a Compound semiconductors $x Reliability. $3 486793
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