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Scanning tunneling microscopy[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	620.1/1
書名/作者:	Scanning tunneling microscopy/ edited by Joseph A. Stroscio and William J. Kaiser.
其他作者:	Stroscio, Joseph Anthony,
出版者:	Boston : : Academic Press,, c1993.
面頁冊數:	1 online resource (xvii, 459 p.) : : ill. (some col.)
標題:	Scanning tunneling microscopy.
ISBN:	9780124759725
ISBN:	0124759726
書目註:	Includes bibliographical references and index.
內容註:	J. Tersoff and N.D. Lang, Theory of Scanning Tunneling Microscopy. S.-I. Park and R.C. Barrett, Design Considerations for an STM System. H.K. Wickramasinghe, Extensions of STM. J.A. Stroscio and R.M. Feenstra, Tunneling Spectroscopy. R. Becker and R. Wolkow, Semiconductor Surfaces. Y. Kuk, Metal Surfaces. L.D. Bell, W.J. Kaiser, M.H. Hecht, and L.C. Davis, Ballistic Electron Emission Microscopy. R.V. Coleman, Z. Dai, W.W. McNairy, C.G. Slough, and C. Wang, Charge-Density Waves. H.F. Hess, Superconductors. Chapter References. Subject Index.
摘要、提要註:	Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.
電子資源:	http://www.sciencedirect.com/science/book/9780124759725

Scanning tunneling microscopy[electronic resource] /
Scanning tunneling microscopy[electronic resource] /edited by Joseph A. Stroscio and William J. Kaiser. - Boston :Academic Press,c1993. - 1 online resource (xvii, 459 p.) :ill. (some col.) - Methods of experimental physics. - Methods of experimental physics..

Includes bibliographical references and index.

J. Tersoff and N.D. Lang, Theory of Scanning Tunneling Microscopy. S.-I. Park and R.C. Barrett, Design Considerations for an STM System. H.K. Wickramasinghe, Extensions of STM. J.A. Stroscio and R.M. Feenstra, Tunneling Spectroscopy. R. Becker and R. Wolkow, Semiconductor Surfaces. Y. Kuk, Metal Surfaces. L.D. Bell, W.J. Kaiser, M.H. Hecht, and L.C. Davis, Ballistic Electron Emission Microscopy. R.V. Coleman, Z. Dai, W.W. McNairy, C.G. Slough, and C. Wang, Charge-Density Waves. H.F. Hess, Superconductors. Chapter References. Subject Index.

Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.

ISBN: 9780124759725

Source: 81781:81781Elsevier Science & Technologyhttp://www.sciencedirect.comSubjects--Topical Terms:

486224
Scanning tunneling microscopy.
Index Terms--Genre/Form:

336502
Electronic books.

LC Class. No.: QH212.S35 / S265 1993eb

Dewey Class. No.: 620.1/1

Scanning tunneling microscopy[electronic resource] /
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520 $a Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.
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