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Modeling nanoscale imaging in electr...
~
Binev, Peter.
Modeling nanoscale imaging in electron microscopy[electronic resource] /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
502.825
書名/作者:
Modeling nanoscale imaging in electron microscopy/ edited by Thomas Vogt, Wolfgang Dahmen, Peter Binev.
其他作者:
Dahmen, Wolfgang.
出版者:
Boston, MA : : Springer US,, 2012.
面頁冊數:
ix, 182 p. : : ill., digital ;; 24 cm.
Contained By:
Springer eBooks
標題:
Scanning transmission electron microscopy - Simulation methods.
標題:
Image analysis.
標題:
Materials Science.
標題:
Characterization and Evaluation of Materials.
標題:
Analytical Chemistry.
標題:
Nanotechnology.
標題:
Theoretical and Computational Chemistry.
標題:
Measurement Science and Instrumentation.
ISBN:
9781461421917 (electronic bk.)
ISBN:
9781461421900 (paper)
電子資源:
http://dx.doi.org/10.1007/978-1-4614-2191-7
Modeling nanoscale imaging in electron microscopy[electronic resource] /
Modeling nanoscale imaging in electron microscopy
[electronic resource] /edited by Thomas Vogt, Wolfgang Dahmen, Peter Binev. - Boston, MA :Springer US,2012. - ix, 182 p. :ill., digital ;24 cm. - Nanostructure science and technology,1571-5744. - Nanostructure science and technology..
ISBN: 9781461421917 (electronic bk.)Subjects--Topical Terms:
468845
Scanning transmission electron microscopy
--Simulation methods.
LC Class. No.: QH212.S34 / M63 2012
Dewey Class. No.: 502.825
Modeling nanoscale imaging in electron microscopy[electronic resource] /
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