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Built-in-self-test and digital self-...

Bou-Sleiman, Sleiman.

Built-in-self-test and digital self-calibration for RF SoCs[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.38412
書名/作者:	Built-in-self-test and digital self-calibration for RF SoCs/ by Sleiman Bou-Sleiman, Mohammed Ismail.
作者:	Bou-Sleiman, Sleiman.
其他作者:	Ismail, Mohammed.
出版者:	New York, NY : : Springer Science+Business Media, LLC,, 2012.
面頁冊數:	xvii, 89 p. : : digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Radio circuits - Design and construction.
標題:	Radio circuits - Testing.
標題:	Systems on a chip - Design and construction.
標題:	Systems on a chip - Testing.
標題:	Automatic test equipment.
標題:	Engineering.
標題:	Circuits and Systems.
標題:	Signal, Image and Speech Processing.
標題:	Electronic Circuits and Devices.
ISBN:	9781441995483 (electronic bk.)
ISBN:	9781441995476 (paper)
電子資源:	http://dx.doi.org/10.1007/978-1-4419-9548-3

Built-in-self-test and digital self-calibration for RF SoCs[electronic resource] /
Bou-Sleiman, Sleiman.

Built-in-self-test and digital self-calibration for RF SoCs[electronic resource] /by Sleiman Bou-Sleiman, Mohammed Ismail. - New York, NY :Springer Science+Business Media, LLC,2012. - xvii, 89 p. :digital ;24 cm. - SpringerBriefs in electrical and computer engineering. - SpringerBriefs in electrical and computer engineering..

ISBN: 9781441995483 (electronic bk.)Subjects--Topical Terms:

417221
Radio circuits
--Design and construction.

LC Class. No.: TK6561 / .B68 2012

Dewey Class. No.: 621.38412

Built-in-self-test and digital self-calibration for RF SoCs[electronic resource] /
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