Characterization of semiconductor he...
Lamberti, Carlo.

 

  • Characterization of semiconductor heterostructures and nanostructures[electronic resource] /
  • 紀錄類型: 書目-語言資料,印刷品 : Monograph/item
    杜威分類號: 537.6226
    書名/作者: Characterization of semiconductor heterostructures and nanostructures/ edited by Carlo Lamberti.
    其他作者: Lamberti, Carlo.
    出版者: Amsterdam ; : Elsevier,, 2008.
    面頁冊數: ix, 486 p., [3] p. of plates : : ill. (some col.) ;; 25 cm.
    標題: Semiconductors.
    標題: Heterostructures.
    標題: Nanostructures.
    ISBN: 9780444530998
    ISBN: 0444530991
    書目註: Includes bibliographical references and index.
    內容註: Chapter 1. Introduction (C. Lamberti) -- Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni) -- Chapter 3. Electrical and optical properties of heterostructures (TBC) -- Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi) -- Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo) -- Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli) -- Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo) -- Chapter 8. Raman Spectroscopy (D. Wolverson) -- Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini) -- Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schulli) -- Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier) -- Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo) -- Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev).
    電子資源: An electronic book accessible through the World Wide Web; click for information
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