大葉大學圖書館 |

登入

回首頁

Noncontact atomic force microscopy /

Meyer, E.

Noncontact atomic force microscopy /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	620/.5
書名/作者:	Noncontact atomic force microscopy // S. Morita, R. Wiesendanger, E. Meyer, (eds.)
其他作者:	Morita, S.
出版者:	Berlin ; : Springer,, c2002.
面頁冊數:	xviii, 439 p. : : ill. ;; 25 cm.
叢書名:	Nanoscience and technology,
標題:	Atomic force microscopy.
ISBN:	9783540431176 (hbk.) :
ISBN:	3540431179 (hbk.)
書目註:	Includes bibliographical references and index.
內容註:	Introduction / Seizo Morita -- Principle of NC-AFM / Franz J. Giessibl -- Semiconductor surfaces / Seizo Morita, Yasuhiro Sugawara -- Bias dependence of NC-AFM images and tunneling current variations on semiconductor surfaces / Toyoko Arai, Masahiko Tomitori -- Alkali halides / Roland Bennewitz, Martin Bammerlin, Ernst Meyer -- Atomic resolution imaging on fluorides / Michael Reichling, Clemens Barth -- Atomically resolved imaging of a NiO(001) surface / Hirotaka Hosoi ... [et al.] -- Atomic structure, order and disorder on high temperature reconstructed Ü-Al₂O₃(0001) / Clemens Barth, Michael Reichling -- NC-AFM imaging of surface recontructions and metal growth on oxides / Chi Lun Pang, Geoff Thornton -- Atoms and molecules on TiO₂(110) and CeO₂(111) surfaces / Ken-ichi Fukui, Yasuhiro Iwasawa -- NC-AFM imaging of adsorbed molecules / Yasuhiro Sugawara -- Organic molecular films / Hirofumi Yamada -- Single-molecule analysis / Akira Sasahara, Hiroshi Onishi -- Low-temperature measurements: Principles, instrumentation, and application / Wolf Allers, Alexander Schwarz, Udo D. Scwarz -- Theory of non-contact atomic force microscopy / Masaru Tsukada ... [et al.] -- Chemical interaction in NC-AFM on semiconductor surfaces / San-Huang Ke ... [et al.] -- Contrast mechanisms on insulating surfaces / Adam Foster ... [et al.] -- Analysis of microscopy and spectroscopy experiments / Hendrik Holscher -- Theory of energy dissipation into surface vibrations / Michel Gauthier, Lev Kantorovich, Masaru Tsukada -- Measurement of dissipation induced by tip-sample interactions / H.J. Hug, A. Baratoff.

Noncontact atomic force microscopy /
Noncontact atomic force microscopy /S. Morita, R. Wiesendanger, E. Meyer, (eds.) - Berlin ;Springer,c2002. - xviii, 439 p. :ill. ;25 cm. - Nanoscience and technology,1434-4904.

Includes bibliographical references and index.

Introduction / Seizo Morita -- Principle of NC-AFM / Franz J. Giessibl -- Semiconductor surfaces / Seizo Morita, Yasuhiro Sugawara -- Bias dependence of NC-AFM images and tunneling current variations on semiconductor surfaces / Toyoko Arai, Masahiko Tomitori -- Alkali halides / Roland Bennewitz, Martin Bammerlin, Ernst Meyer -- Atomic resolution imaging on fluorides / Michael Reichling, Clemens Barth -- Atomically resolved imaging of a NiO(001) surface / Hirotaka Hosoi ... [et al.] -- Atomic structure, order and disorder on high temperature reconstructed Ü-Al₂O₃(0001) / Clemens Barth, Michael Reichling -- NC-AFM imaging of surface recontructions and metal growth on oxides / Chi Lun Pang, Geoff Thornton -- Atoms and molecules on TiO₂(110) and CeO₂(111) surfaces / Ken-ichi Fukui, Yasuhiro Iwasawa -- NC-AFM imaging of adsorbed molecules / Yasuhiro Sugawara -- Organic molecular films / Hirofumi Yamada -- Single-molecule analysis / Akira Sasahara, Hiroshi Onishi -- Low-temperature measurements: Principles, instrumentation, and application / Wolf Allers, Alexander Schwarz, Udo D. Scwarz -- Theory of non-contact atomic force microscopy / Masaru Tsukada ... [et al.] -- Chemical interaction in NC-AFM on semiconductor surfaces / San-Huang Ke ... [et al.] -- Contrast mechanisms on insulating surfaces / Adam Foster ... [et al.] -- Analysis of microscopy and spectroscopy experiments / Hendrik Holscher -- Theory of energy dissipation into surface vibrations / Michel Gauthier, Lev Kantorovich, Masaru Tsukada -- Measurement of dissipation induced by tip-sample interactions / H.J. Hug, A. Baratoff.

ISBN: 9783540431176 (hbk.) :NTD7,044

LCCN: 2002021665Subjects--Topical Terms:

238194
Atomic force microscopy.

LC Class. No.: QH212.A78 / N65 2002

Dewey Class. No.: 620/.5

Noncontact atomic force microscopy /
LDR:02291cam a22002054a 4500 001 340446
005 20030109082344.0
008 110622s2002 gw a b 001 0 eng
010 $a 2002021665
020 $a 9783540431176 (hbk.) : $c NTD7,044
020 $a 3540431179 (hbk.)
040 $a DLC $c DLC $d OHX $d C#P $d WPG $d DYU
041 0 $a eng
050 0 0 $a QH212.A78 $b N65 2002
082 0 0 $a 620/.5 $2 21
245 0 0 $a Noncontact atomic force microscopy / $c S. Morita, R. Wiesendanger, E. Meyer, (eds.)
260 $a Berlin ; $a New York : $b Springer, $c c2002.
300 $a xviii, 439 p. : $b ill. ; $c 25 cm.
440 0 $a Nanoscience and technology, $x 1434-4904
504 $a Includes bibliographical references and index.
505 0 $a Introduction / Seizo Morita -- Principle of NC-AFM / Franz J. Giessibl -- Semiconductor surfaces / Seizo Morita, Yasuhiro Sugawara -- Bias dependence of NC-AFM images and tunneling current variations on semiconductor surfaces / Toyoko Arai, Masahiko Tomitori -- Alkali halides / Roland Bennewitz, Martin Bammerlin, Ernst Meyer -- Atomic resolution imaging on fluorides / Michael Reichling, Clemens Barth -- Atomically resolved imaging of a NiO(001) surface / Hirotaka Hosoi ... [et al.] -- Atomic structure, order and disorder on high temperature reconstructed Ü-Al₂O₃(0001) / Clemens Barth, Michael Reichling -- NC-AFM imaging of surface recontructions and metal growth on oxides / Chi Lun Pang, Geoff Thornton -- Atoms and molecules on TiO₂(110) and CeO₂(111) surfaces / Ken-ichi Fukui, Yasuhiro Iwasawa -- NC-AFM imaging of adsorbed molecules / Yasuhiro Sugawara -- Organic molecular films / Hirofumi Yamada -- Single-molecule analysis / Akira Sasahara, Hiroshi Onishi -- Low-temperature measurements: Principles, instrumentation, and application / Wolf Allers, Alexander Schwarz, Udo D. Scwarz -- Theory of non-contact atomic force microscopy / Masaru Tsukada ... [et al.] -- Chemical interaction in NC-AFM on semiconductor surfaces / San-Huang Ke ... [et al.] -- Contrast mechanisms on insulating surfaces / Adam Foster ... [et al.] -- Analysis of microscopy and spectroscopy experiments / Hendrik Holscher -- Theory of energy dissipation into surface vibrations / Michel Gauthier, Lev Kantorovich, Masaru Tsukada -- Measurement of dissipation induced by tip-sample interactions / H.J. Hug, A. Baratoff.
650 0 $a Atomic force microscopy. $3 238194
700 1 $a Morita, S. $q (Seizo), $d 1948- $3 412206
700 1 $a Wiesendanger, R. $q (Roland), $d 1961- $3 412207
700 1 $a Meyer, E. $q (Ernst) $3 412208