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Architecture design for soft errors[...

Mukherjee, Shubu.

Architecture design for soft errors[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.3815
書名/作者:	Architecture design for soft errors/ Shubu Mukherjee.
作者:	Mukherjee, Shubu.
出版者:	Amsterdam ; : Morgan Kaufmann Publishers/Elsevier,, c2008.
面頁冊數:	xxi, 337 p. : : ill. ;; 25 cm.
標題:	Integrated circuits.
標題:	Integrated circuits - Effect of radiation on.
標題:	Computer architecture.
標題:	System design.
ISBN:	9780123695291
ISBN:	0123695295
書目註:	Includes bibliographical references and index.
內容註:	Device- and circuit-level modeling, measurement, and mitigation -- Architectural vulnerability analysis -- Advanced architectural vulnerability analysis -- Error coding techniques -- Fault detection via redundant execution -- Hardware error recovery -- Software detection and recovery.
摘要、提要註:	This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them.
電子資源:	An electronic book accessible through the World Wide Web; click for information
電子資源:	An electronic book accessible through the World Wide Web; click for information
電子資源:	http://www.loc.gov/catdir/enhancements/fy0805/2007048527-d.html

Architecture design for soft errors[electronic resource] /
Mukherjee, Shubu.

Architecture design for soft errors[electronic resource] /Shubu Mukherjee. - Amsterdam ;Morgan Kaufmann Publishers/Elsevier,c2008. - xxi, 337 p. :ill. ;25 cm.

Includes bibliographical references and index.

Device- and circuit-level modeling, measurement, and mitigation -- Architectural vulnerability analysis -- Advanced architectural vulnerability analysis -- Error coding techniques -- Fault detection via redundant execution -- Hardware error recovery -- Software detection and recovery.

This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them.

Electronic reproduction.
Amsterdam :
Elsevier Science & Technology,
2008.

Mode of access: World Wide Web.

ISBN: 9780123695291

Source: 116264:116362Elsevier Science & Technologyhttp://www.sciencedirect.comSubjects--Topical Terms:

205514
Integrated circuits.
Index Terms--Genre/Form:

336502
Electronic books.

LC Class. No.: TK7874 / .M86143 2008eb

Dewey Class. No.: 621.3815

Architecture design for soft errors[electronic resource] /
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007 cr cn|||||||||
008 110620s2008 ne a ob 001 0 eng d
020 $a 9780123695291
020 $a 0123695295
029 1 $a NZ1 $b 13068805
035 $a (OCoLC)281596190
035 $a ocn281596190
037 $a 116264:116362 $b Elsevier Science & Technology $n http://www.sciencedirect.com
040 $a OPELS $b eng $c OPELS $d OPELS
049 $a TEFA
050 1 4 $a TK7874 $b .M86143 2008eb
082 0 4 $a 621.3815 $2 22
100 1 $a Mukherjee, Shubu. $3 403765
245 1 0 $a Architecture design for soft errors $h [electronic resource] / $c Shubu Mukherjee.
260 $a Amsterdam ; $a Boston : $b Morgan Kaufmann Publishers/Elsevier, $c c2008.
300 $a xxi, 337 p. : $b ill. ; $c 25 cm.
504 $a Includes bibliographical references and index.
505 0 $a Device- and circuit-level modeling, measurement, and mitigation -- Architectural vulnerability analysis -- Advanced architectural vulnerability analysis -- Error coding techniques -- Fault detection via redundant execution -- Hardware error recovery -- Software detection and recovery.
520 $a This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them.
533 $a Electronic reproduction. $b Amsterdam : $c Elsevier Science & Technology, $d 2008. $n Mode of access: World Wide Web. $n System requirements: Web browser. $n Title from title screen (viewed on Dec. 9, 2008). $n Access may be restricted to users at subscribing institutions.
650 0 $a Integrated circuits. $3 205514
650 0 $a Integrated circuits $x Effect of radiation on. $3 403766
650 0 $a Computer architecture. $3 172048
650 0 $a System design. $3 172186
655 7 $a Electronic books. $2 local $3 336502
710 2 $a ScienceDirect (Online service) $3 365609
776 1 $c Original $z 0123695295 $z 9780123695291 $w (DLC) 2007048527 $w (OCoLC)176924795
856 4 0 $3 ScienceDirect $u http://www.sciencedirect.com/science/book/9780123695291 $z An electronic book accessible through the World Wide Web; click for information
856 4 0 $3 Referex $u http://www.engineeringvillage.com/controller/servlet/OpenURL?genre=book&isbn=9780123695291 $z An electronic book accessible through the World Wide Web; click for information
856 4 2 $3 Publisher description $u http://www.loc.gov/catdir/enhancements/fy0805/2007048527-d.html
994 $a C0 $b TEF

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http://www.sciencedirect.com/science/book/9780123695291
http://www.engineeringvillage.com/controller/servlet/OpenURL?genre=book&isbn=9780123695291
http://www.loc.gov/catdir/enhancements/fy0805/2007048527-d.html

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