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Physical principles of electron micr...

EgertonRay F.

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
書名/作者:	Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM/ Egerton,Ray F.
作者:	EgertonRay F.
出版者:	New York : Springer, 2005
面頁冊數:	202頁; 25x16公分
標題:	Electron microscopy
ISBN:	0387258000(精裝)

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM
EgertonRay F.

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEMEgerton,Ray F. - 1st ed - New YorkSpringer2005 - 202頁25x16公分

ISBN: 0387258000(精裝)Subjects--Topical Terms:

143589
Electron microscopy

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM
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