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Materials characterization[electroni...
~
Leng, Y.
Materials characterization[electronic resource] :introduction to microscopic and spectroscopic methods /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
620.11
書名/作者:
Materials characterization : introduction to microscopic and spectroscopic methods // Yang Leng.
作者:
Leng, Y.
出版者:
Weinheim, Germany : : Wiley-VCH,, c2013.
面頁冊數:
1 online resource (xiv, 376 p.)
標題:
Materials.
標題:
Materials - Analysis.
ISBN:
9783527670772 (electronic bk.)
ISBN:
3527670777 (electronic bk.)
ISBN:
9783527670802 (electronic bk.)
ISBN:
3527670807 (electronic bk.)
書目註:
Includes bibliographical references and index.
內容註:
Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
摘要、提要註:
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
電子資源:
http://onlinelibrary.wiley.com/book/10.1002/9783527670772
Materials characterization[electronic resource] :introduction to microscopic and spectroscopic methods /
Leng, Y.
Materials characterization
introduction to microscopic and spectroscopic methods /[electronic resource] :Yang Leng. - 2nd ed. - Weinheim, Germany :Wiley-VCH,c2013. - 1 online resource (xiv, 376 p.)
Includes bibliographical references and index.
Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
ISBN: 9783527670772 (electronic bk.)Subjects--Topical Terms:
183582
Materials.
LC Class. No.: TA403 / .L433 2013
Dewey Class. No.: 620.11
Materials characterization[electronic resource] :introduction to microscopic and spectroscopic methods /
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introduction to microscopic and spectroscopic methods /
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Includes bibliographical references and index.
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Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
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Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
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http://onlinelibrary.wiley.com/book/10.1002/9783527670772
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