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Spectroscopic ellipsometry :practica...

Hilfiker, James N.

Spectroscopic ellipsometry :practical application to thin film characterization /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	620.1/1295
書名/作者:	Spectroscopic ellipsometry : : practical application to thin film characterization // Harland G. Tompkins and James N. Hilfiker.
作者:	Tompkins, Harland G.
其他作者:	Hilfiker, James N.
出版者:	New York : : Momentum Press,, c2016.
面頁冊數:	xxiii, 159 p. : : ill. ;; 23 cm.
標題:	Ellipsometry.
標題:	Thin films - Measurement.
標題:	Spectrum analysis - Measurement.
ISBN:	9781606507278 (pbk.) :
書目註:	Includes bibliographical references (p. [151]-154) and index.

Spectroscopic ellipsometry :practical application to thin film characterization /
Tompkins, Harland G.

Spectroscopic ellipsometry :practical application to thin film characterization /Harland G. Tompkins and James N. Hilfiker. - New York :Momentum Press,c2016. - xxiii, 159 p. :ill. ;23 cm. - Materials characterization and analysis collection,2377-4347. - Materials characterization and analysis collection..

Includes bibliographical references (p. [151]-154) and index.

ISBN: 9781606507278 (pbk.) :NTD 1,573Subjects--Topical Terms:

611825
Ellipsometry.

LC Class. No.: QC443 / .T647 2016

Dewey Class. No.: 620.1/1295

Spectroscopic ellipsometry :practical application to thin film characterization /
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700 1 $a Hilfiker, James N. $3 693533
830 0 $a Materials characterization and analysis collection. $3 693534